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LEICA GEOSYSTEMS HDS, INC
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SAN RAMONE, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for efficient storage and manipulation of extreme...
Patent number
7,373,473
Issue date
May 13, 2008
Leica Geosystems HDS LLC
Richard William Bukowski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Laser operation for survey instruments
Patent number
7,323,670
Issue date
Jan 29, 2008
Leica Geosystems HDS LLC
Gregory C. Walsh
G01 - MEASURING TESTING
Information
Patent Grant
Advanced applications for 3-D autoscanning LIDAR system
Patent number
7,313,506
Issue date
Dec 25, 2007
Leica Geosystems HDS, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
7,215,430
Issue date
May 8, 2007
Leica Geosystems HDS LLC
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
Contact-free slip ring for survey instrumentation
Patent number
7,187,823
Issue date
Mar 6, 2007
Leica Geosystems HDS LLC
Jerry Dimsdale
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
7,184,036
Issue date
Feb 27, 2007
Leica Geosystems HDS LLC
Jerry Dimsdale
G01 - MEASURING TESTING
Information
Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
Patent number
6,847,462
Issue date
Jan 25, 2005
Leica Geosystems HDS, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
System and method for acquiring tie-point location information on a...
Patent number
6,804,380
Issue date
Oct 12, 2004
Leica Geosystems HDS, Inc.
Dimitrios Ioannou
G01 - MEASURING TESTING
Information
Patent Grant
Advance applications for 3-D autoscanning LIDAR system
Patent number
6,781,683
Issue date
Aug 24, 2004
Leica Geosystems HDS, Inc.
Ben K. Kacyra
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for identifying the points that lie on a surfa...
Patent number
6,771,840
Issue date
Aug 3, 2004
Leica Geosystems HDS, Inc.
Dimitrios Ioannou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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last 30 trademarks