LEO Elektronenmikroskopie GmbH

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NEW YORK, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Corrector for correcting first-order chromatic aberrations of the f...
- Patent number 7,012,262
- Issue date Mar 14, 2006
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manipulator for an optical or particle-optical apparatus
- Patent number 6,894,288
- Issue date May 17, 2005
- LEO Elektronenmikroskopie GmbH
- Helmut Müller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system having a mirror corrector
- Patent number 6,855,939
- Issue date Feb 15, 2005
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam source, electron optical apparatus using such beam so...
- Patent number 6,828,565
- Issue date Dec 7, 2004
- LEO Elektronenmikroskopie GmbH
- Michael Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with annular illuminating aperture
- Patent number 6,797,956
- Issue date Sep 28, 2004
- LEO Elektronenmikroskopie GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus wherein ionizing radiation is generated
- Patent number 6,787,779
- Issue date Sep 7, 2004
- LEO Elektronenmikroskopie GmbH
- Daniel Tobias
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector for correcting first-order chromatic aberrations of the f...
- Patent number 6,784,437
- Issue date Aug 31, 2004
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for electron beam lithography, and electron-optical lithogr...
- Patent number 6,657,211
- Issue date Dec 2, 2003
- Leo Elektronenmikroskopie
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optic illuminating and imaging system with a condenser-obj...
- Patent number 6,531,698
- Issue date Mar 11, 2003
- LEO Elektronenmikroskopie GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device
- Patent number 6,498,345
- Issue date Dec 24, 2002
- LEO Elektronenmikroskopie GmbH
- Eugen Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with an energy filter having hexapole corrector...
- Patent number 6,384,412
- Issue date May 7, 2002
- LEO Elektronenmikroskopie GmbH
- Dieter Krahl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus with energy filter
- Patent number 6,239,430
- Issue date May 29, 2001
- LEO Elektronenmikroskopie GmbH
- Eugen Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus
- Patent number 6,194,729
- Issue date Feb 27, 2001
- LEO Elektronenmikroskopie GmbH
- Eugen Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positron source
- Patent number 6,043,489
- Issue date Mar 28, 2000
- Leo Elektronenmikroskopie GmbH
- Martin Tongbhoyai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter, particularly for an electron microscope
- Patent number 6,040,576
- Issue date Mar 21, 2000
- Leo Elektronenmikroskopie GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
Corrector for correcting first-order chromatic aberrations of the f...
- Publication number 20060102848
- Publication date May 18, 2006
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- B82 - NANO-TECHNOLOGY
Information Patent Application
Material processing system and method
- Publication number 20050103272
- Publication date May 19, 2005
- LEO Elektronenmikroskopie GmbH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Corrector for correcting first-order chromatic aberrations of the f...
- Publication number 20050023480
- Publication date Feb 3, 2005
- LEO Elektronenmikroskopie GmbH
- Harald Rose
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron microscopy system, electron microscopy method and focusing...
- Publication number 20050006582
- Publication date Jan 13, 2005
- LEO Elektronenmikroskopie GmbH
- Michael Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam source, electron optical apparatus using such beam so...
- Publication number 20040124365
- Publication date Jul 1, 2004
- LEO Elektronenmikroskopie GmbH
- Michael Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical apparatus and method for operating the same
- Publication number 20040113092
- Publication date Jun 17, 2004
- LEO Elektronenmikroskopie GmbH
- Rainer Knippelmeyer
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Electron microscopy system
- Publication number 20040108457
- Publication date Jun 10, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical apparatus, electron microscopy system and electron...
- Publication number 20040105160
- Publication date Jun 3, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- B82 - NANO-TECHNOLOGY
Information Patent Application
Beam guiding arrangement, imaging method, electron microscopy syste...
- Publication number 20040084621
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Objective lens for an electron microscopy system and electron micro...
- Publication number 20040084629
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical arrangements and particle-optical systems
- Publication number 20040075053
- Publication date Apr 22, 2004
- LEO Elektronenmikroskopie GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscopy system and electron microscopy method
- Publication number 20040075054
- Publication date Apr 22, 2004
- LEO Elektronenmikroskopie GmbH
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for the electron-microscopic observation of a semiconductor...
- Publication number 20040065827
- Publication date Apr 8, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Applications operating with beams of charged particles
- Publication number 20040056193
- Publication date Mar 25, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS

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Trademarklast 30 trademarks

Information Trademark
76531872 - CONCISE
- Serial number 76531872
- Registration number 3189727
- Filing date Jul 24, 2003
- LEO Elektronenmikroskopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76522678 - SUPRA
- Serial number 76522678
- Registration number 2929413
- Filing date Jun 13, 2003
- LEO Elektronenmikroskopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76522679 - XVP
- Serial number 76522679
- Registration number 2929414
- Filing date Jun 13, 2003
- LEO Elektronenmikroskopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76343745 - CROSS BEAM
- Serial number 76343745
- Registration number 2896436
- Filing date Dec 1, 2001
- LEO Elektronenmikroskopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76335780 - LIBRA
- Serial number 76335780
- Registration number 2901045
- Filing date Nov 8, 2001
- LEO Elektronenmikroskopie GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

LEO Elektronenmikroskopie GmbH

Organization

Patents Grantslast 30 patents

Corrector for correcting first-order chromatic aberrations of the f...

Manipulator for an optical or particle-optical apparatus

Particle beam system having a mirror corrector

Electron beam source, electron optical apparatus using such beam so...

Electron microscope with annular illuminating aperture

Apparatus wherein ionizing radiation is generated

Corrector for correcting first-order chromatic aberrations of the f...

Process for electron beam lithography, and electron-optical lithogr...

Particle-optic illuminating and imaging system with a condenser-obj...

Particle beam device

Electron microscope with an energy filter having hexapole corrector...

Particle beam apparatus with energy filter

Particle beam apparatus

Positron source

Energy filter, particularly for an electron microscope

Patents Applicationslast 30 patents

Corrector for correcting first-order chromatic aberrations of the f...

Material processing system and method

Corrector for correcting first-order chromatic aberrations of the f...

Electron microscopy system, electron microscopy method and focusing...

Electron beam source, electron optical apparatus using such beam so...

Particle-optical apparatus and method for operating the same

Electron microscopy system

Particle-optical apparatus, electron microscopy system and electron...

Beam guiding arrangement, imaging method, electron microscopy syste...

Objective lens for an electron microscopy system and electron micro...

Particle-optical arrangements and particle-optical systems

Electron microscopy system and electron microscopy method

Method for the electron-microscopic observation of a semiconductor...

Applications operating with beams of charged particles

Trademarklast 30 trademarks

76531872 - CONCISE

76522678 - SUPRA

76522679 - XVP

76343745 - CROSS BEAM

76335780 - LIBRA