Litel Instruments, Inc.

Organization

San Diego, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Precision geographic location system and method utilizing an image...
- Patent number 10,222,178
- Issue date Mar 5, 2019
- Litel Instruments
- Robert O. Hunter
- F41 - WEAPONS
Information Patent Grant
System and method for advanced navigation
- Patent number 9,903,719
- Issue date Feb 27, 2018
- Litel Instruments
- Robert O. Hunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for high accuracy and reliability registration of...
- Patent number 9,483,816
- Issue date Nov 1, 2016
- Litel Instruments
- Adlai H. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Precision geographic location system and method utilizing an image...
- Patent number 9,074,848
- Issue date Jul 7, 2015
- Litel Instruments
- Robert O. Hunter
- F41 - WEAPONS
Information Patent Grant
Method and apparatus for measurement of exit pupil transmittance
- Patent number 8,786,827
- Issue date Jul 22, 2014
- Litel Instruments
- Adlai H. Smith
- G02 - OPTICS
Information Patent Grant
Method and apparatus for self-referenced wafer stage positional err...
- Patent number 7,871,002
- Issue date Jan 18, 2011
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced wafer stage positional err...
- Patent number 7,871,004
- Issue date Jan 18, 2011
- Litel Instruments
- Adlai Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for determination of focus and telecentricity,...
- Patent number 7,846,624
- Issue date Dec 7, 2010
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determination of source polarization matrix
- Patent number 7,697,138
- Issue date Apr 13, 2010
- Litel Instruments
- Adlai H. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of exit pupil transmittance
- Patent number 7,688,426
- Issue date Mar 30, 2010
- Litel Instruments
- Adlai H. Smith
- G02 - OPTICS
Information Patent Grant
Apparatus and process for determination of dynamic lens field curva...
- Patent number 7,671,979
- Issue date Mar 2, 2010
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for embedded encoding of overlay data ordering...
- Patent number 7,598,006
- Issue date Oct 6, 2009
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measurement of crossfield chromatic respon...
- Patent number 7,544,449
- Issue date Jun 9, 2009
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
In-situ interferometer arrangement
- Patent number 7,515,250
- Issue date Apr 7, 2009
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle for use in rapid determination of average intrafield scanni...
- Patent number 7,442,951
- Issue date Oct 28, 2008
- Litel Instruments
- Adlai Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference wafer calibration reticle
- Patent number 7,381,503
- Issue date Jun 3, 2008
- Litel Instruments
- Adlai H. Smith
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for registration with integral alignment optics
- Patent number 7,337,552
- Issue date Mar 4, 2008
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and process for the determination of static lens field cu...
- Patent number 7,295,291
- Issue date Nov 13, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
In-situ interferometer arrangement
- Patent number 7,286,208
- Issue date Oct 23, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
In-situ interferometer arrangement
- Patent number 7,283,202
- Issue date Oct 16, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced wafer stage positional err...
- Patent number 7,271,905
- Issue date Sep 18, 2007
- Litel Instruments
- Adlai Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced dynamic step and scan intr...
- Patent number 7,268,360
- Issue date Sep 11, 2007
- Litel Instruments
- Adlai H. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for determination of optimized exposure conditions for tran...
- Patent number 7,261,985
- Issue date Aug 28, 2007
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced dynamic step and scan intr...
- Patent number 7,262,398
- Issue date Aug 28, 2007
- Litel Instruments
- Adlai Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference wafer and process for manufacturing same
- Patent number 7,261,983
- Issue date Aug 28, 2007
- Litel Instruments
- Adlai H. Smith
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Reference wafer and process for manufacturing same
- Patent number 7,160,657
- Issue date Jan 9, 2007
- Litel Instruments
- Adlai Smith
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and apparatus for self-referenced dynamic step and scan intr...
- Patent number 7,136,144
- Issue date Nov 14, 2006
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and process for determination of dynamic scan field curva...
- Patent number 7,126,668
- Issue date Oct 24, 2006
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for self-referenced projection lens distortion...
- Patent number 7,099,011
- Issue date Aug 29, 2006
- Litel Instruments
- Bruce McArthur
- G02 - OPTICS
Information Patent Grant
Apparatus and method for high resolution in-situ illumination sourc...
- Patent number 7,088,427
- Issue date Aug 8, 2006
- Litel Instruments
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ADVANCED NAVIGATION
- Publication number 20170023365
- Publication date Jan 26, 2017
- LITEL INSTRUMENTS
- Robert O. Hunter
- G01 - MEASURING TESTING
Information Patent Application
METHOD & SYSTEM FOR HIGH ACCURACY & RELIABILITY REGISTRATION OF MUL...
- Publication number 20150324989
- Publication date Nov 12, 2015
- LITEL INSTRUMENTS
- Adlai H. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASUREMENT OF EXIT PUPIL TRANSMITTANCE
- Publication number 20110007298
- Publication date Jan 13, 2011
- LITEL INSTRUMENTS
- Adlai H. Smith
- G02 - OPTICS
Information Patent Application
In-situ interferometer arrangement
- Publication number 20050264783
- Publication date Dec 1, 2005
- LITEL INSTRUMENTS
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
In-situ interferometer arrangement
- Publication number 20050237541
- Publication date Oct 27, 2005
- LITEL INSTRUMENTS
- Adlai H. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
In-situ source metrology instrument and method of use
- Publication number 20030007143
- Publication date Jan 9, 2003
- LITEL INSTRUMENTS
- Bruce B. McArthur
- G01 - MEASURING TESTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
85764559 - LITEL MAC
- Serial number 85764559
- Filing date Oct 26, 2012
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85763425 - LITEL GPP
- Serial number 85763425
- Filing date Oct 25, 2012
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76667865 - HYPER NA ISI
- Serial number 76667865
- Registration number 3402311
- Filing date Oct 23, 2006
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76666541 - HEIGHT MAPPER (ZMAP)
- Serial number 76666541
- Filing date Sep 22, 2006
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76666540 - HYPER NA SMI
- Serial number 76666540
- Registration number 3398944
- Filing date Sep 22, 2006
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76666231 - POLARIZATION MAPPER (PMAP)
- Serial number 76666231
- Filing date Sep 18, 2006
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76634075 - LUMENA
- Serial number 76634075
- Filing date Mar 22, 2005
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76633381 - PREDICTIVELITHOGRAPHY
- Serial number 76633381
- Filing date Mar 14, 2005
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76597005 - HIGH ACCURACY INSPECSTEP INTERFEROMETER (HA-ISI)
- Serial number 76597005
- Registration number 3112428
- Filing date Jun 14, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76587120 - ADVANCED SOURCE METROLOGY INSTRUMENT (ASMI)
- Serial number 76587120
- Registration number 3124040
- Filing date Apr 14, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76587118 - HIGH ACCURACY IN-SITU INTERFEROMETER (HA-ISI)
- Serial number 76587118
- Registration number 3112409
- Filing date Apr 14, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76587121 - HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI).
- Serial number 76587121
- Registration number 3124041
- Filing date Apr 14, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76578263 - DISTORTION MAPPER (DMAP)
- Serial number 76578263
- Registration number 3114654
- Filing date Feb 26, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76578264 - TRANSMISSION MAPPER (TMAP)
- Serial number 76578264
- Registration number 3283359
- Filing date Feb 26, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76574003 - LITEL INSTRUMENTS
- Serial number 76574003
- Filing date Jan 20, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76574017 - IN-SITU INTERFEROMETER (ISI)
- Serial number 76574017
- Registration number 3109731
- Filing date Jan 16, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76574016 - SOURCE METROLOGY INSTRUMENT (SMI)
- Serial number 76574016
- Registration number 3101233
- Filing date Jan 16, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76574018 - INSPECSTEP INTERFEROMETER (ISI)
- Serial number 76574018
- Registration number 3112383
- Filing date Jan 16, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76571269 - PREDICTIVE LITHOGRAPHY
- Serial number 76571269
- Filing date Jan 12, 2004
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76529520 - USE THE STANDARD
- Serial number 76529520
- Registration number 2929439
- Filing date Jul 14, 2003
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76521581 - ANALYSIS CHARACTERIZATION ENGINE (ACE)
- Serial number 76521581
- Registration number 2946542
- Filing date Jun 9, 2003
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74148697 - LITEL INSTRUMENTS
- Serial number 74148697
- Filing date Mar 18, 1991
- LITEL INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74148781 - LITEL INSTRUMENTS
- Serial number 74148781
- Filing date Mar 18, 1991
- LITEL INSTRUMENTS
- 42 - Scientific and technological services and research and design relating thereto

Litel Instruments, Inc.

Organization

Patents Grantslast 30 patents

Precision geographic location system and method utilizing an image...

System and method for advanced navigation

Method and system for high accuracy and reliability registration of...

Precision geographic location system and method utilizing an image...

Method and apparatus for measurement of exit pupil transmittance

Method and apparatus for self-referenced wafer stage positional err...

Method and apparatus for self-referenced wafer stage positional err...

Systems and methods for determination of focus and telecentricity,...

Method and apparatus for determination of source polarization matrix

Method and apparatus for measurement of exit pupil transmittance

Apparatus and process for determination of dynamic lens field curva...

Method and apparatus for embedded encoding of overlay data ordering...

Method and apparatus for measurement of crossfield chromatic respon...

In-situ interferometer arrangement

Reticle for use in rapid determination of average intrafield scanni...

Reference wafer calibration reticle

Method and apparatus for registration with integral alignment optics

Apparatus and process for the determination of static lens field cu...

In-situ interferometer arrangement

In-situ interferometer arrangement

Method and apparatus for self-referenced wafer stage positional err...

Method and apparatus for self-referenced dynamic step and scan intr...

Process for determination of optimized exposure conditions for tran...

Method and apparatus for self-referenced dynamic step and scan intr...

Reference wafer and process for manufacturing same

Reference wafer and process for manufacturing same

Method and apparatus for self-referenced dynamic step and scan intr...

Apparatus and process for determination of dynamic scan field curva...

Method and apparatus for self-referenced projection lens distortion...

Apparatus and method for high resolution in-situ illumination sourc...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ADVANCED NAVIGATION

METHOD & SYSTEM FOR HIGH ACCURACY & RELIABILITY REGISTRATION OF MUL...

METHOD AND APPARATUS FOR MEASUREMENT OF EXIT PUPIL TRANSMITTANCE

In-situ interferometer arrangement

In-situ interferometer arrangement

In-situ source metrology instrument and method of use

Trademarklast 30 trademarks

85764559 - LITEL MAC

85763425 - LITEL GPP

76667865 - HYPER NA ISI

76666541 - HEIGHT MAPPER (ZMAP)

76666540 - HYPER NA SMI

76666231 - POLARIZATION MAPPER (PMAP)

76634075 - LUMENA

76633381 - PREDICTIVELITHOGRAPHY

76597005 - HIGH ACCURACY INSPECSTEP INTERFEROMETER (HA-ISI)

76587120 - ADVANCED SOURCE METROLOGY INSTRUMENT (ASMI)

76587118 - HIGH ACCURACY IN-SITU INTERFEROMETER (HA-ISI)

76587121 - HIGH ACCURACY SOURCE METROLOGY INSTRUMENT (HA-SMI).

76578263 - DISTORTION MAPPER (DMAP)

76578264 - TRANSMISSION MAPPER (TMAP)

76574003 - LITEL INSTRUMENTS

76574017 - IN-SITU INTERFEROMETER (ISI)

76574016 - SOURCE METROLOGY INSTRUMENT (SMI)

76574018 - INSPECSTEP INTERFEROMETER (ISI)

76571269 - PREDICTIVE LITHOGRAPHY

76529520 - USE THE STANDARD

76521581 - ANALYSIS CHARACTERIZATION ENGINE (ACE)

74148697 - LITEL INSTRUMENTS

74148781 - LITEL INSTRUMENTS