LOGICVISION, INC

Organization

SAN JOSE, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for at-speed testing of memory interface using scan
- Patent number 7,617,425
- Issue date Nov 10, 2009
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for measuring delay of high speed signals
- Patent number 7,453,255
- Issue date Nov 18, 2008
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Clocking methodology for at-speed testing of scan circuits with syn...
- Patent number 7,424,656
- Issue date Sep 9, 2008
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for collecting memory failure information
- Patent number 7,370,251
- Issue date May 6, 2008
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair circuit and method
- Patent number 7,257,733
- Issue date Aug 14, 2007
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Boundary scan with strobed pad driver enable
- Patent number 7,219,282
- Issue date May 15, 2007
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for at-speed testing of scan circuits
- Patent number 7,194,669
- Issue date Mar 20, 2007
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method of and program product for performing gate-level diagnosis o...
- Patent number 7,191,374
- Issue date Mar 13, 2007
- LogicVision, Inc.
- Fadi Maamari
- G01 - MEASURING TESTING
Information Patent Grant
Memory repair analysis method and circuit
- Patent number 7,188,274
- Issue date Mar 6, 2007
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for measuring jitter of high speed signals
- Patent number 7,158,899
- Issue date Jan 2, 2007
- LogicVision, Inc.
- Stephen K. Sunter
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit and method for adding parametric test capability to digital...
- Patent number 7,159,159
- Issue date Jan 2, 2007
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Clock controller for at-speed testing of scan circuits
- Patent number 7,155,651
- Issue date Dec 26, 2006
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method and test circuit for testing memory internal write enable
- Patent number 7,139,946
- Issue date Nov 21, 2006
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Verification of embedded test structures in circuit designs
- Patent number 7,103,860
- Issue date Sep 5, 2006
- LogicVision, Inc.
- Paul Price
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system and program product for testing and/or diagnosing ci...
- Patent number 6,961,871
- Issue date Nov 1, 2005
- LogicVision, Inc.
- Givargis A. Danialy
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for testing high speed data circuits
- Patent number 6,895,535
- Issue date May 17, 2005
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for accurately applying a voltage to a node of a...
- Patent number 6,885,213
- Issue date Apr 26, 2005
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Method and program product for detecting bus conflict and floating...
- Patent number 6,883,134
- Issue date Apr 19, 2005
- LogicVision, Inc.
- Fadi Maamari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and program product for designing hierarchical circuit for q...
- Patent number 6,868,532
- Issue date Mar 15, 2005
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method and program product for designing hierarchical circuit for q...
- Patent number 6,862,717
- Issue date Mar 1, 2005
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing embedded memory array and embedded memory control...
- Patent number 6,834,361
- Issue date Dec 21, 2004
- LogicVision, Inc.
- Robert A. Abbott
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of designing circuit having multiple test access ports, circ...
- Patent number 6,829,730
- Issue date Dec 7, 2004
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method for scan testing of digital circuit, digital circuit for use...
- Patent number 6,763,489
- Issue date Jul 13, 2004
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Test access circuit and method of accessing embedded test controlle...
- Patent number 6,760,874
- Issue date Jul 6, 2004
- LogicVision, Inc.
- Jean-Francois Côté
- G01 - MEASURING TESTING
Information Patent Grant
Method of masking corrupt bits during signature analysis and circui...
- Patent number 6,745,359
- Issue date Jun 1, 2004
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Grant
Method for collecting failure information for a memory using an emb...
- Patent number 6,738,938
- Issue date May 18, 2004
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and program product for completing a circuit design having e...
- Patent number 6,725,435
- Issue date Apr 20, 2004
- LogicVision, Inc.
- Jean-François Côté
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method for determining the location of defect in a circuit
- Patent number 6,717,415
- Issue date Apr 6, 2004
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit for testing high frequency mixed signal circuits...
- Patent number 6,703,820
- Issue date Mar 9, 2004
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Method for scan controlled sequential sampling of analog signals an...
- Patent number 6,691,269
- Issue date Feb 10, 2004
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR AT-SPEED TESTING OF MEMORY INTERFACE USING SCAN
- Publication number 20100037109
- Publication date Feb 11, 2010
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR STORING AND DISTRIBUTING MEMORY REPAIR INF...
- Publication number 20080065929
- Publication date Mar 13, 2008
- LogicVision, Inc.
- Benoit NADEAU-DOSTIE
- G11 - INFORMATION STORAGE
Information Patent Application
Insertion of embedded test in RTL to GDSII flow
- Publication number 20050273683
- Publication date Dec 8, 2005
- LogicVision, Inc.
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Application
Clocking methodology for at-speed testing of scan circuits with syn...
- Publication number 20050240790
- Publication date Oct 27, 2005
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Application
Masking circuit and method of masking corrupted bits
- Publication number 20050240848
- Publication date Oct 27, 2005
- LogicVision, Inc.
- Jean-Francois Cote
- G01 - MEASURING TESTING
Information Patent Application
Clock controller for at-speed testing of scan circuits
- Publication number 20050240847
- Publication date Oct 27, 2005
- LogicVision, Inc.
- Benoit Nadeau-Dostie
- G01 - MEASURING TESTING
Information Patent Application
Circuit and method for low frequency testing of high frequency sign...
- Publication number 20050229053
- Publication date Oct 13, 2005
- LogicVision, Inc., 101 Metro Drive, 3rd Floor, San Jose, CA, 95110
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Application
Method and circuit for testing high frequency mixed signal circuits...
- Publication number 20030071606
- Publication date Apr 17, 2003
- LOGICVISION, INC.
- Stephen K. Sunter
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77576058 - SILICON QUALITY AT THE RIGHT COST
- Serial number 77576058
- Filing date Sep 22, 2008
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77407740 - DRAGONFLY
- Serial number 77407740
- Registration number 3624205
- Filing date Feb 27, 2008
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77284913 - YIELD INSIGHT
- Serial number 77284913
- Registration number 3825541
- Filing date Sep 20, 2007
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77284832 - LOGICVISION
- Serial number 77284832
- Registration number 3435237
- Filing date Sep 20, 2007
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77284887 - SILICON INSIGHT
- Serial number 77284887
- Registration number 3435241
- Filing date Sep 20, 2007
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78496616 - ETCHECKER
- Serial number 78496616
- Registration number 3020734
- Filing date Oct 7, 2004
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78377274 - EYES IN THE DIE
- Serial number 78377274
- Registration number 3127630
- Filing date Mar 2, 2004
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78336957 - LOGICVISION VALIDATOR
- Serial number 78336957
- Filing date Dec 5, 2003
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78155024 - VALIDATOR
- Serial number 78155024
- Filing date Aug 16, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76430977 - BIST
- Serial number 76430977
- Filing date Jul 15, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76430992 - EMBEDDED TEST
- Serial number 76430992
- Filing date Jul 15, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76430975 - VALIDATOR
- Serial number 76430975
- Filing date Jul 15, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76430991 - LV VALIDATOR
- Serial number 76430991
- Filing date Jul 15, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76431244 - LOGICVISION READY
- Serial number 76431244
- Filing date Jul 15, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76431245 - LV READY
- Serial number 76431245
- Filing date Jul 15, 2002
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75768412 - TEST@SPEED
- Serial number 75768412
- Filing date Aug 3, 1999
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75665572 - EATE
- Serial number 75665572
- Filing date Mar 22, 1999
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75147370
- Serial number 75147370
- Registration number 2097329
- Filing date Aug 8, 1996
- LogicVision, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75135727 - BIST ON BOARD
- Serial number 75135727
- Registration number 2117595
- Filing date Jul 17, 1996
- LV Software, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

LOGICVISION, INC

Organization

Patents Grantslast 30 patents

Method for at-speed testing of memory interface using scan

Circuit and method for measuring delay of high speed signals

Clocking methodology for at-speed testing of scan circuits with syn...

Method and circuit for collecting memory failure information

Memory repair circuit and method

Boundary scan with strobed pad driver enable

Method and circuit for at-speed testing of scan circuits

Method of and program product for performing gate-level diagnosis o...

Memory repair analysis method and circuit

Circuit and method for measuring jitter of high speed signals

Circuit and method for adding parametric test capability to digital...

Clock controller for at-speed testing of scan circuits

Method and test circuit for testing memory internal write enable

Verification of embedded test structures in circuit designs

Method, system and program product for testing and/or diagnosing ci...

Circuit and method for testing high speed data circuits

Circuit and method for accurately applying a voltage to a node of a...

Method and program product for detecting bus conflict and floating...

Method and program product for designing hierarchical circuit for q...

Method and program product for designing hierarchical circuit for q...

Method of testing embedded memory array and embedded memory control...

Method of designing circuit having multiple test access ports, circ...

Method for scan testing of digital circuit, digital circuit for use...

Test access circuit and method of accessing embedded test controlle...

Method of masking corrupt bits during signature analysis and circui...

Method for collecting failure information for a memory using an emb...

Method and program product for completing a circuit design having e...

Circuit and method for determining the location of defect in a circuit

Method and circuit for testing high frequency mixed signal circuits...

Method for scan controlled sequential sampling of analog signals an...

Patents Applicationslast 30 patents

METHOD FOR AT-SPEED TESTING OF MEMORY INTERFACE USING SCAN

METHOD AND APPARATUS FOR STORING AND DISTRIBUTING MEMORY REPAIR INF...

Insertion of embedded test in RTL to GDSII flow

Clocking methodology for at-speed testing of scan circuits with syn...

Masking circuit and method of masking corrupted bits

Clock controller for at-speed testing of scan circuits

Circuit and method for low frequency testing of high frequency sign...

Method and circuit for testing high frequency mixed signal circuits...

Trademarklast 30 trademarks

77576058 - SILICON QUALITY AT THE RIGHT COST

77407740 - DRAGONFLY

77284913 - YIELD INSIGHT

77284832 - LOGICVISION

77284887 - SILICON INSIGHT

78496616 - ETCHECKER

78377274 - EYES IN THE DIE

78336957 - LOGICVISION VALIDATOR

78155024 - VALIDATOR

76430977 - BIST

76430992 - EMBEDDED TEST

76430975 - VALIDATOR

76430991 - LV VALIDATOR

76431244 - LOGICVISION READY

76431245 - LV READY

75768412 - TEST@SPEED

75665572 - EATE

75147370

75135727 - BIST ON BOARD