LPTEX Corporation

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Don't-care-bit identification method and don't-care-bit identificat...
- Patent number 8,589,751
- Issue date Nov 19, 2013
- LPTEX Corporation
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Target logic value determination method for unspecified bit in test...
- Patent number 8,453,023
- Issue date May 28, 2013
- LPTEX Corporation
- Kohei Miyase
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test program of semiconductor logic circuit device
- Patent number 8,117,513
- Issue date Feb 14, 2012
- LPTEX Corporation
- Xiaoqing Wen
- G01 - MEASURING TESTING