Lumina Instruments Inc.

Organization

San Jose, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Surface contour measurement
- Patent number 12,146,732
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Slope, p-component and s-component measurement
- Patent number 12,146,830
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Scanning micro profiler
- Patent number 12,147,033
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Region prober optical inspector
- Patent number 11,988,615
- Issue date May 21, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,733,173
- Issue date Aug 22, 2023
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Region prober optical inspector
- Patent number 11,255,796
- Issue date Feb 22, 2022
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Scattered radiation defect depth detection
- Patent number 10,767,977
- Issue date Sep 8, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Scattered radiation optical scanner
- Patent number 10,648,928
- Issue date May 12, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Grant
Phase retardance optical scanner
- Patent number 10,641,713
- Issue date May 5, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
REGION PROBER OPTICAL INSPECTOR
- Publication number 20200319116
- Publication date Oct 8, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
SCATTERED RADIATION DEFECT DEPTH DETECTION
- Publication number 20200278192
- Publication date Sep 3, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING

Lumina Instruments Inc.

Organization

Patents Grantslast 30 patents

Surface contour measurement

Slope, p-component and s-component measurement

Scanning micro profiler

Angle independent optical surface inspector

Region prober optical inspector

Time domain multiplexed defect scanner

Region prober optical inspector

Scattered radiation defect depth detection

Scattered radiation optical scanner

Phase retardance optical scanner

Patents Applicationslast 30 patents

REGION PROBER OPTICAL INSPECTOR

SCATTERED RADIATION DEFECT DEPTH DETECTION

Trademarklast 30 trademarks