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Lumina Instruments Inc.
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Surface contour measurement
Patent number
12,146,732
Issue date
Nov 19, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Slope, p-component and s-component measurement
Patent number
12,146,830
Issue date
Nov 19, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Scanning micro profiler
Patent number
12,147,033
Issue date
Nov 19, 2024
Lumina Instruments Inc.
Steven W. Meeks
G02 - OPTICS
Information
Patent Grant
Angle independent optical surface inspector
Patent number
12,130,243
Issue date
Oct 29, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Region prober optical inspector
Patent number
11,988,615
Issue date
May 21, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Time domain multiplexed defect scanner
Patent number
11,733,173
Issue date
Aug 22, 2023
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Region prober optical inspector
Patent number
11,255,796
Issue date
Feb 22, 2022
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Scattered radiation defect depth detection
Patent number
10,767,977
Issue date
Sep 8, 2020
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Scattered radiation optical scanner
Patent number
10,648,928
Issue date
May 12, 2020
Lumina Instruments Inc.
Steven W. Meeks
G02 - OPTICS
Information
Patent Grant
Phase retardance optical scanner
Patent number
10,641,713
Issue date
May 5, 2020
Lumina Instruments Inc.
Steven W. Meeks
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
REGION PROBER OPTICAL INSPECTOR
Publication number
20200319116
Publication date
Oct 8, 2020
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Application
SCATTERED RADIATION DEFECT DEPTH DETECTION
Publication number
20200278192
Publication date
Sep 3, 2020
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Trademark
last 30 trademarks