Lumina Instruments Inc.

Organization

  • San Jose, CA, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    REGION PROBER OPTICAL INSPECTOR

    • Publication number 20200319116
    • Publication date Oct 8, 2020
    • Lumina Instruments Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCATTERED RADIATION DEFECT DEPTH DETECTION

    • Publication number 20200278192
    • Publication date Sep 3, 2020
    • Lumina Instruments Inc.
    • Steven W. Meeks
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks