LUXTRON CORPORATION

Organization

MOUNTAIN VIEW, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
In situ optical surface temperature measuring techniques and devices
- Patent number 7,374,335
- Issue date May 20, 2008
- Luxtron Corporation
- John P. Gotthold
- G01 - MEASURING TESTING
Information Patent Grant
In situ optical surface temperature measuring techniques and devices
- Patent number 7,080,940
- Issue date Jul 25, 2006
- Luxtron Corporation
- John P. Gotthold
- G01 - MEASURING TESTING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 7,042,581
- Issue date May 9, 2006
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 6,934,040
- Issue date Aug 23, 2005
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 6,654,132
- Issue date Nov 25, 2003
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
In situ optical surface temperature measuring techniques and devices
- Patent number 6,572,265
- Issue date Jun 3, 2003
- Luxtron Corporation
- John P. Gotthold
- G01 - MEASURING TESTING
Information Patent Grant
Optical techniques for measuring layer thicknesses and other surfac...
- Patent number 6,570,662
- Issue date May 27, 2003
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques of measuring endpoint during the processing of m...
- Patent number 6,426,232
- Issue date Jul 30, 2002
- Luxtron Corporation
- Herbert E. Litvak
- B24 - GRINDING POLISHING
Information Patent Grant
Liquid etch endpoint detection and process metrology
- Patent number 6,406,641
- Issue date Jun 18, 2002
- Luxtron Corporation
- Reza Golzarian
- G01 - MEASURING TESTING
Information Patent Grant
Polarization interferometer spectrometer with rotatable birefringen...
- Patent number 6,222,632
- Issue date Apr 24, 2001
- Luxtron Corporation
- Dmitry V. Bakin
- G01 - MEASURING TESTING
Information Patent Grant
Optical techniques of measuring endpoint during the processing of m...
- Patent number 6,110,752
- Issue date Aug 29, 2000
- Luxtron Corporation
- Herbert E. Litvak
- B24 - GRINDING POLISHING
Information Patent Grant
Optical techniques of measuring endpoint during the processing of m...
- Patent number 6,077,452
- Issue date Jun 20, 2000
- Luxtron Corporation
- Herbert E. Litvak
- B24 - GRINDING POLISHING
Information Patent Grant
Signal processing for in situ monitoring of the formation or remova...
- Patent number 6,028,669
- Issue date Feb 22, 2000
- Luxtron Corporation
- Huey M. Tzeng
- G01 - MEASURING TESTING
Information Patent Grant
In situ technique for monitoring and controlling a process of chemi...
- Patent number 6,010,538
- Issue date Jan 4, 2000
- Luxtron Corporation
- Mei H. Sun
- G05 - CONTROLLING REGULATING
Information Patent Grant
Interference removal
- Patent number 5,946,082
- Issue date Aug 31, 1999
- Luxtron Corporation
- Herbert E. Litvak
- G01 - MEASURING TESTING
Information Patent Grant
Electro optical board assembly for measuring the temperature of an...
- Patent number 5,897,610
- Issue date Apr 27, 1999
- Luxtron Corporation
- Earl M. Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Optical techniques of measuring endpoint during the processing of m...
- Patent number 5,891,352
- Issue date Apr 6, 1999
- Luxtron Corporation
- Herbert E. Litvak
- B24 - GRINDING POLISHING
Information Patent Grant
Interference removal
- Patent number 5,786,886
- Issue date Jul 28, 1998
- Luxtron Corporation
- Herbert E. Litvak
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,769,540
- Issue date Jun 23, 1998
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical board assembly for measuring the temperature of an...
- Patent number 5,717,608
- Issue date Feb 10, 1998
- Luxtron Corporation
- Earl M. Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Optical techniques of measuring endpoint during the processing of m...
- Patent number 5,695,660
- Issue date Dec 9, 1997
- Luxtron Corporation
- Herbert E. Litvak
- B24 - GRINDING POLISHING
Information Patent Grant
Temperature measuring system having improved signal processing and...
- Patent number 5,600,147
- Issue date Feb 4, 1997
- Luxtron Corporation
- Earl M. Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Optical techniques of measuring endpoint during the processing of m...
- Patent number 5,499,733
- Issue date Mar 19, 1996
- Luxtron Corporation
- Herbert E. Litvak
- B24 - GRINDING POLISHING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,490,728
- Issue date Feb 13, 1996
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring temperatures at a plurality of l...
- Patent number 5,470,155
- Issue date Nov 28, 1995
- Luxtron Corporation
- Earl M. Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Autocalibrating non-contact temperature measuring technique employi...
- Patent number 5,464,284
- Issue date Nov 7, 1995
- Luxtron Corporation
- Dieter L. Rall
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system employing a luminescent sensor and methods of desi...
- Patent number 5,414,266
- Issue date May 9, 1995
- Luxtron Corporation
- Mei H. Sun
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for monitoring a temperature using a thermally...
- Patent number 5,364,186
- Issue date Nov 15, 1994
- Luxtron Corporation
- Zhihai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Processing endpoint detecting technique and detector structure usin...
- Patent number 5,362,969
- Issue date Nov 8, 1994
- Luxtron Corporation
- Daniel E. Glenn
- B24 - GRINDING POLISHING
Information Patent Grant
Modular luminescence-based measuring system using fast digital sign...
- Patent number 5,351,268
- Issue date Sep 27, 1994
- Luxtron Corporation
- Earl M. Jensen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN SITU OPTICAL SURFACE TEMPERATURE MEASURING TECHNIQUES AND DEVICES
- Publication number 20080225926
- Publication date Sep 18, 2008
- Luxtron Corporation
- John P. Gotthold
- G01 - MEASURING TESTING
Information Patent Application
In situ optical surface temperature measuring techniques and devices
- Publication number 20060140248
- Publication date Jun 29, 2006
- Luxtron Corporation
- John P. Gotthold
- G01 - MEASURING TESTING
Information Patent Application
Optical techniques for measuring layer thicknesses and other surfac...
- Publication number 20050105103
- Publication date May 19, 2005
- Luxtron Corporation
- Charles W. Schietinger
- B24 - GRINDING POLISHING
Information Patent Application
In situ optical surface temperature measuring techniques and devices
- Publication number 20040258130
- Publication date Dec 23, 2004
- Luxtron Corporation
- John P. Gotthold
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77883898 - LUMASMART
- Serial number 77883898
- Registration number 3821130
- Filing date Dec 2, 2009
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78656476 - ILLUMA
- Serial number 78656476
- Filing date Jun 22, 2005
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78306554 - THERMASSET
- Serial number 78306554
- Registration number 2934229
- Filing date Sep 29, 2003
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75644381 - TRUETEMP
- Serial number 75644381
- Filing date Feb 18, 1999
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75327345 - TRUETEMP
- Serial number 75327345
- Filing date Jul 21, 1997
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75327712 - RIPPLE
- Serial number 75327712
- Filing date Jul 21, 1997
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75327713 - QUICKVIEW
- Serial number 75327713
- Registration number 2298629
- Filing date Jul 21, 1997
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75327714 - OPTIVIEW
- Serial number 75327714
- Registration number 2263586
- Filing date Jul 21, 1997
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75264397 - OPTIMA 9000
- Serial number 75264397
- Registration number 2373200
- Filing date Mar 13, 1997
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74090171 - ACCUFIBER
- Serial number 74090171
- Registration number 1656089
- Filing date Aug 21, 1990
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73616762 - FLUOROPTIC
- Serial number 73616762
- Registration number 1451873
- Filing date Aug 26, 1986
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73616723 - LUXTRON
- Serial number 73616723
- Registration number 1449416
- Filing date Aug 26, 1986
- LUXTRON CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

LUXTRON CORPORATION

Organization

Patents Grantslast 30 patents

In situ optical surface temperature measuring techniques and devices

In situ optical surface temperature measuring techniques and devices

Optical techniques for measuring layer thicknesses and other surfac...

Optical techniques for measuring layer thicknesses and other surfac...

Optical techniques for measuring layer thicknesses and other surfac...

In situ optical surface temperature measuring techniques and devices

Optical techniques for measuring layer thicknesses and other surfac...

Optical techniques of measuring endpoint during the processing of m...

Liquid etch endpoint detection and process metrology

Polarization interferometer spectrometer with rotatable birefringen...

Optical techniques of measuring endpoint during the processing of m...

Optical techniques of measuring endpoint during the processing of m...

Signal processing for in situ monitoring of the formation or remova...

In situ technique for monitoring and controlling a process of chemi...

Interference removal

Electro optical board assembly for measuring the temperature of an...

Optical techniques of measuring endpoint during the processing of m...

Interference removal

Non-contact optical techniques for measuring surface conditions

Electro-optical board assembly for measuring the temperature of an...

Optical techniques of measuring endpoint during the processing of m...

Temperature measuring system having improved signal processing and...

Optical techniques of measuring endpoint during the processing of m...

Non-contact optical techniques for measuring surface conditions

Apparatus and method for measuring temperatures at a plurality of l...

Autocalibrating non-contact temperature measuring technique employi...

Measuring system employing a luminescent sensor and methods of desi...

Apparatus and method for monitoring a temperature using a thermally...

Processing endpoint detecting technique and detector structure usin...

Modular luminescence-based measuring system using fast digital sign...

Patents Applicationslast 30 patents

IN SITU OPTICAL SURFACE TEMPERATURE MEASURING TECHNIQUES AND DEVICES

In situ optical surface temperature measuring techniques and devices

Optical techniques for measuring layer thicknesses and other surfac...

In situ optical surface temperature measuring techniques and devices

Trademarklast 30 trademarks

77883898 - LUMASMART

78656476 - ILLUMA

78306554 - THERMASSET

75644381 - TRUETEMP

75327345 - TRUETEMP

75327712 - RIPPLE

75327713 - QUICKVIEW

75327714 - OPTIVIEW

75264397 - OPTIMA 9000

74090171 - ACCUFIBER

73616762 - FLUOROPTIC

73616723 - LUXTRON