M2N INC.

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Gyeonggi-do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Probe card and manufacturing method
- Patent number 9,671,431
- Issue date Jun 6, 2017
- M2N Inc.
- Young Geun Park
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating probe tip
- Patent number 8,287,745
- Issue date Oct 16, 2012
- M2N Inc.
- Ki Pil Hong
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating probe for use in scanning probe microscope
- Patent number 7,767,101
- Issue date Aug 3, 2010
- M2N Inc.
- Young Geun Park
- G01 - MEASURING TESTING
Information Patent Grant
Micro piezoelectric actuator and method for fabricating same
- Patent number 6,995,499
- Issue date Feb 7, 2006
- M2N Inc.
- Kyu-Ho Hwang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND MANUFACTURING METHOD
- Publication number 20130342232
- Publication date Dec 26, 2013
- M2N INC.
- Young Geun Park
- G01 - MEASURING TESTING
Information Patent Application
Method For Fabricating Probe Tip
- Publication number 20100163518
- Publication date Jul 1, 2010
- M2N INC.
- Ki Pil Hong
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20100134126
- Publication date Jun 3, 2010
- M2N, INC.
- Ki-Pil Hong
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING PROBE FOR USE IN SCANNING PROBE MICROSCOPE
- Publication number 20080272087
- Publication date Nov 6, 2008
- M2N INC.
- Young Geun Park
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning probe microscope and method for fabricating same
- Publication number 20060073627
- Publication date Apr 6, 2006
- M2N INC.
- Young-Geun Park
- G01 - MEASURING TESTING

Trademarklast 30 trademarks