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Seattle, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Jitter estimating apparatus and estimating method
Patent number
6,990,417
Issue date
Jan 24, 2006
Advantest Corporation
Takahiro Yamaguchi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
Apparatus for measuring jitter and method of measuring jitter
Publication number
20060268970
Publication date
Nov 30, 2006
Advantest Corporation
Kiyotaka Ichiyama
G01 - MEASURING TESTING
Information
Patent Application
Test apparatus and test method
Publication number
20060184332
Publication date
Aug 17, 2006
Advantest Corporation
Masahiro Ishida
G01 - MEASURING TESTING
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last 30 trademarks