Marktec Corporation

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current probe with transverse polygonal detecting coil
- Patent number 6,791,319
- Issue date Sep 14, 2004
- Marktec Corporation
- Tatsuo Hiroshima
- G01 - MEASURING TESTING
Information Patent Grant
Colored magnetic particles for magnetophoretic display and method f...
- Patent number 6,705,874
- Issue date Mar 16, 2004
- Marktec Corporation
- Akihiro Koyama
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Ultraviolet light permeable filter for flaw detection light and met...
- Patent number 6,563,126
- Issue date May 13, 2003
- Marktec Corporation
- Masami Motoyama
- G01 - MEASURING TESTING
Information Patent Grant
Ultraviolet light permeable filter for flaw detection light, and me...
- Patent number 6,525,315
- Issue date Feb 25, 2003
- Marktec Corporation
- Masami Motoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Eddy current testing probe
- Publication number 20040075429
- Publication date Apr 22, 2004
- Marktec Corporation
- Tatsuo Hiroshima
- G01 - MEASURING TESTING
Information Patent Application
Ultraviolet light permeable filter for flaw detection light and met...
- Publication number 20030075694
- Publication date Apr 24, 2003
- Marktec Corporation
- Masami Motoyama
- G02 - OPTICS

Trademarklast 30 trademarks