MATERIALS ANALYSIS TECHNOLOGY (US) CORP

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Analysis system, auxiliary analysis apparatus and analysis method
- Patent number 12,154,775
- Issue date Nov 26, 2024
- Materials Analysis Technology Inc.
- Yu-Teh Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of sample collection component
- Patent number 11,959,834
- Issue date Apr 16, 2024
- Materials Analysis Technology Inc.
- Pin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Physical analysis method, sample for physical analysis and preparin...
- Patent number 11,955,312
- Issue date Apr 9, 2024
- Materials Analysis Technology Inc.
- Chien-Wei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analyzing method and sample preparing method
- Patent number 11,946,945
- Issue date Apr 2, 2024
- Materials Analysis Technology Inc.
- Keng-Chieh Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample carrier device and method for operating the same
- Patent number 11,291,991
- Issue date Apr 5, 2022
- Materials Analysis Technology Inc.
- Hung-Jen Chen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Carrier device and carrier kit
- Patent number 11,282,669
- Issue date Mar 22, 2022
- Materials Analysis Technology Inc.
- Hung-Jen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid sample drying apparatus, dried sample test piece and prepara...
- Patent number 10,416,050
- Issue date Sep 17, 2019
- Materials Analysis Technology, Inc.
- Lin-Ai Tai
- G01 - MEASURING TESTING
Information Patent Grant
Sample collection device and manufacturing method thereof
- Patent number 10,379,075
- Issue date Aug 13, 2019
- Materials Analysis Technology Inc.
- Pin Chang
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Sample collection component and manufacturing method thereof
- Patent number 10,309,875
- Issue date Jun 4, 2019
- Materials Analysis Technology Inc.
- Pin Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation system and preparation method for an electron mi...
- Patent number 10,267,713
- Issue date Apr 23, 2019
- Materials Analysis Technology Inc.
- Hung-Jen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Dimension calculation method for a semiconductor device
- Patent number 9,558,565
- Issue date Jan 31, 2017
- MATERIALS ANALYSIS TECHNOLOGY INC.
- Sajal Biring
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen preparation for transmission electron microscopy
- Patent number 9,384,942
- Issue date Jul 5, 2016
- National Health Research Institutes
- Yong-fen Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Specimen preparation for transmission electron microscopy
- Patent number 8,969,827
- Issue date Mar 3, 2015
- Materials Analysis Technology (US) Corp.
- Yong-Fen Hsieh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MANUFACTURING METHOD OF SAMPLE COLLECTION COMPONENT
- Publication number 20230332985
- Publication date Oct 19, 2023
- Materials Analysis Technology Inc.
- Pin Chang
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS SYSTEM, AUXILIARY ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20230326730
- Publication date Oct 12, 2023
- Materials Analysis Technology Inc.
- YU-TEH CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURVE ALIGNMENT METHOD AND CURVE ALIGNMENT APPARATUS
- Publication number 20230326000
- Publication date Oct 12, 2023
- Materials Analysis Technology Inc.
- Hsiang-Yu Tsou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOLDERING QUALITY INSPECTION METHOD AND SOLDERING QUALITY INSPECTIO...
- Publication number 20230029432
- Publication date Jan 26, 2023
- MATERIALS ANALYSIS TECHNOLOGY INC
- Shang-En Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE ANALYZING METHOD AND SAMPLE PREPARING METHOD
- Publication number 20220334140
- Publication date Oct 20, 2022
- Materials Analysis Technology Inc.
- KENG-CHIEH CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL ANALYSIS METHOD, SAMPLE FOR PHYSICAL ANALYSIS AND PREPARIN...
- Publication number 20220223373
- Publication date Jul 14, 2022
- Materials Analysis Technology Inc.
- CHIEN-WEI WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CARRIER DEVICE AND CARRIER KIT
- Publication number 20220013325
- Publication date Jan 13, 2022
- Materials Analysis Technology Inc.
- HUNG-JEN CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE CARRIER DEVICE AND METHOD FOR OPERATING THE SAME
- Publication number 20200398271
- Publication date Dec 24, 2020
- Materials Analysis Technology Inc.
- HUNG-JEN CHEN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MANUFACTURING METHOD OF SAMPLE COLLECTION COMPONENT
- Publication number 20190226946
- Publication date Jul 25, 2019
- Materials Analysis Technology Inc.
- Pin Chang
- G02 - OPTICS
Information Patent Application
SAMPLE PREPARATION SYSTEM AND PREPARATION METHOD
- Publication number 20180095015
- Publication date Apr 5, 2018
- Materials Analysis Technology Inc.
- Hung-Jen Chen
- G01 - MEASURING TESTING
Information Patent Application
DIMENSION CALCULATION METHOD FOR A SEMICONDUCTOR DEVICE
- Publication number 20150228065
- Publication date Aug 13, 2015
- MATERIALS ANALYSIS TECHNOLOGY INC
- Sajal BIRING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20150194288
- Publication date Jul 9, 2015
- National Health Research Institutes
- Yong-fen Hsieh
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PREPARATION FOR TEM
- Publication number 20140007709
- Publication date Jan 9, 2014
- National Health Research Institutes
- Yong-Fen HSIEH
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
97241158
- Serial number 97241158
- Registration number 7204646
- Filing date Jan 27, 2022
- Materials Analysis Technology Inc.
- 41 - Education
Information Trademark
97241323
- Serial number 97241323
- Registration number 7166968
- Filing date Jan 27, 2022
- Materials Analysis Technology Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97241231
- Serial number 97241231
- Registration number 7140704
- Filing date Jan 27, 2022
- Materials Analysis Technology Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97238910 - MA-TEK
- Serial number 97238910
- Registration number 6990672
- Filing date Jan 26, 2022
- Materials Analysis Technology Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97231751 - MA-TEK
- Serial number 97231751
- Filing date Jan 21, 2022
- Materials Analysis Technology Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97231818 - MA-TEK
- Serial number 97231818
- Registration number 6985496
- Filing date Jan 21, 2022
- Materials Analysis Technology Inc.
- 41 - Education
Information Trademark
97229558
- Serial number 97229558
- Registration number 7140690
- Filing date Jan 20, 2022
- Materials Analysis Technology Inc.
- 41 - Education
Information Trademark
97229656
- Serial number 97229656
- Registration number 6985170
- Filing date Jan 20, 2022
- Materials Analysis Technology Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97229582
- Serial number 97229582
- Registration number 7134481
- Filing date Jan 20, 2022
- Materials Analysis Technology Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97227964 - THE BEST R&D PARTNER
- Serial number 97227964
- Registration number 7064044
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 41 - Education
Information Trademark
97227895 - THE BEST R&D PARTNER
- Serial number 97227895
- Registration number 6937952
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97227777 - MATEK
- Serial number 97227777
- Registration number 6984902
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97228059 - MATEK THE BEST R&D PARTNER
- Serial number 97228059
- Registration number 7172481
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97228026 - MATEK THE BEST R&D PARTNER
- Serial number 97228026
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97227737 - MATEK
- Serial number 97227737
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97227801 - MATEK
- Serial number 97227801
- Registration number 7140684
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 41 - Education
Information Trademark
97228039 - MATEK THE BEST R&D PARTNER
- Serial number 97228039
- Registration number 7140685
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 41 - Education
Information Trademark
97227940 - THE BEST R&D PARTNER
- Serial number 97227940
- Registration number 6937953
- Filing date Jan 19, 2022
- Materials Analysis Technology Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
87853965
- Serial number 87853965
- Registration number 5765066
- Filing date Mar 28, 2018
- MATERIALS ANALYSIS TECHNOLOGY INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

MATERIALS ANALYSIS TECHNOLOGY (US) CORP

Organization

Patents Grantslast 30 patents

Analysis system, auxiliary analysis apparatus and analysis method

Manufacturing method of sample collection component

Physical analysis method, sample for physical analysis and preparin...

Sample analyzing method and sample preparing method

Sample carrier device and method for operating the same

Carrier device and carrier kit

Liquid sample drying apparatus, dried sample test piece and prepara...

Sample collection device and manufacturing method thereof

Sample collection component and manufacturing method thereof

Sample preparation system and preparation method for an electron mi...

Dimension calculation method for a semiconductor device

Specimen preparation for transmission electron microscopy

Specimen preparation for transmission electron microscopy

Patents Applicationslast 30 patents

MANUFACTURING METHOD OF SAMPLE COLLECTION COMPONENT

ANALYSIS SYSTEM, AUXILIARY ANALYSIS APPARATUS AND ANALYSIS METHOD

CURVE ALIGNMENT METHOD AND CURVE ALIGNMENT APPARATUS

SOLDERING QUALITY INSPECTION METHOD AND SOLDERING QUALITY INSPECTIO...

SAMPLE ANALYZING METHOD AND SAMPLE PREPARING METHOD

PHYSICAL ANALYSIS METHOD, SAMPLE FOR PHYSICAL ANALYSIS AND PREPARIN...

CARRIER DEVICE AND CARRIER KIT

SAMPLE CARRIER DEVICE AND METHOD FOR OPERATING THE SAME

MANUFACTURING METHOD OF SAMPLE COLLECTION COMPONENT

SAMPLE PREPARATION SYSTEM AND PREPARATION METHOD

DIMENSION CALCULATION METHOD FOR A SEMICONDUCTOR DEVICE

SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY

SPECIMEN PREPARATION FOR TEM

Trademarklast 30 trademarks

97241158

97241323

97241231

97238910 - MA-TEK

97231751 - MA-TEK

97231818 - MA-TEK

97229558

97229656

97229582

97227964 - THE BEST R&D PARTNER

97227895 - THE BEST R&D PARTNER

97227777 - MATEK

97228059 - MATEK THE BEST R&D PARTNER

97228026 - MATEK THE BEST R&D PARTNER

97227737 - MATEK

97227801 - MATEK

97228039 - MATEK THE BEST R&D PARTNER

97227940 - THE BEST R&D PARTNER

87853965