Maxone Semiconductor Co., Ltd

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Suzhou, CN

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A WEDGE AMPLITUDE-MODULATION PROBE CARD AND A MAIN BODY THEREOF
- Publication number 20240053384
- Publication date Feb 15, 2024
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao YU
- G01 - MEASURING TESTING
Information Patent Application
A LASER ETCHING METHOD FOR MEMS PROBES
- Publication number 20240001485
- Publication date Jan 4, 2024
- MAXONE SEMICONDUCTOR CO., LTD.
- Haichao YU
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
AN AMPLITUDE-MODULATING PROBE CARD AND ITS PROBE AND AMPLITUDE-MODU...
- Publication number 20230384348
- Publication date Nov 30, 2023
- MAXONE SEMICONDUCTOR CO., LTD.
- Ailin WANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS PROBE CARD
- Publication number 20230324437
- Publication date Oct 12, 2023
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu ZHAO
- G01 - MEASURING TESTING
Information Patent Application
A PROBE CARD FOR TESTING POWER DEVICES UNDER HIGH TEMPERATURE AND H...
- Publication number 20230258690
- Publication date Aug 17, 2023
- MAXONE SEMICONDUCTOR CO., LTD.
- Liangyu ZHAO
- G01 - MEASURING TESTING
Information Patent Application
MEMBRANE PROBE CARD AND ITS PROBE HEAD
- Publication number 20230168279
- Publication date Jun 1, 2023
- Maxone Semiconductor Co., Ltd
- Liangyu ZHAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACHIEVING THE MEASURING SLIP OF MEMBRANE PROBES
- Publication number 20230168280
- Publication date Jun 1, 2023
- Maxone Semiconductor Co., Ltd
- Liangyu ZHAO
- G01 - MEASURING TESTING

Maxone Semiconductor Co., Ltd

Organization

Patents Grantslast 30 patents

Probe card for testing power devices under high temperature and hig...

Patents Applicationslast 30 patents

A WEDGE AMPLITUDE-MODULATION PROBE CARD AND A MAIN BODY THEREOF

A LASER ETCHING METHOD FOR MEMS PROBES

AN AMPLITUDE-MODULATING PROBE CARD AND ITS PROBE AND AMPLITUDE-MODU...

MEMS PROBE CARD

A PROBE CARD FOR TESTING POWER DEVICES UNDER HIGH TEMPERATURE AND H...

MEMBRANE PROBE CARD AND ITS PROBE HEAD

METHOD FOR ACHIEVING THE MEASURING SLIP OF MEMBRANE PROBES

Trademarklast 30 trademarks