MEMSIC SEMICONDUCTOR (WUXI) CO., LTD.

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Patents Grantslast 30 patents

Information Patent Grant
Method for wafer-level chip scale package testing
- Patent number 9,676,619
- Issue date Jun 13, 2017
- MEMSIC SEMICONDUCTOR (WUXI) CO., LTD.
- Yang Zhao
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Magnetic Field Sensor With Three-Dimensional Spiral Reset Coil
- Publication number 20170115363
- Publication date Apr 27, 2017
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
Method For Wafer-Level Chip Scale Package Testing
- Publication number 20170113929
- Publication date Apr 27, 2017
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Yang Zhao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Magnetic Field Sensor With Integrated Self-Test Reset Wire
- Publication number 20170115360
- Publication date Apr 27, 2017
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic Magnetoresistance Sensor
- Publication number 20160313412
- Publication date Oct 27, 2016
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Dalai Li
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE GAS FLUID FLOW MEASURING METHOD AND ITS DEVICE
- Publication number 20110125424
- Publication date May 26, 2011
- MEMSIC SEMICONDUCTOR (WUXI) CO., LTD.
- Huaicheng Han
- G01 - MEASURING TESTING

Trademarklast 30 trademarks