Metris IPR NV

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Leuven, BE

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Patents Grantslast 30 patents

Information Patent Grant
Optical probe for scanning the features of an object and methods th...
- Patent number 7,428,061
- Issue date Sep 23, 2008
- Metris IPR NV
- Bart Van Coppenolle
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for the verification and identification of a meas...
- Patent number 7,268,892
- Issue date Sep 11, 2007
- Metris IPR NV
- Alex Van Den Bossche
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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