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Leuven, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Optical scanning probe
Patent number
8,353,059
Issue date
Jan 8, 2013
Metris N.V.
Stephen James Crampton
G01 - MEASURING TESTING
Information
Patent Grant
Method for the automatic simultaneous synchronization, calibration...
Patent number
7,299,145
Issue date
Nov 20, 2007
Metris N.V.
Lieven De Jonge
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical probe for scanning the features of an object and methods th...
Patent number
7,009,717
Issue date
Mar 7, 2006
Metris N.V.
Bart Van Coppenolle
G01 - MEASURING TESTING
Information
Patent Grant
Method for the automatic calibration-only, or calibration and quali...
Patent number
6,944,564
Issue date
Sep 13, 2005
Metris N.V.
Lieven De Jonge
G01 - MEASURING TESTING
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Patents Applications
last 30 patents
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Patent Application
Optical Scanning Probe
Publication number
20120026510
Publication date
Feb 2, 2012
Metris N.V.
Stephen James Crampton
G01 - MEASURING TESTING
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Patent Application
Optical Scanning Probe
Publication number
20090205088
Publication date
Aug 13, 2009
Metris N.V.
Stephen James Crampton
G01 - MEASURING TESTING
Information
Patent Application
Method for the automatic simultaneous synchronization, calibration...
Publication number
20070043526
Publication date
Feb 22, 2007
Metris N.V.
Lieven De Jonge
G06 - COMPUTING CALCULATING COUNTING