Metroptic Technologies, Ltd.

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Yokneam, IL

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Patents Grantslast 30 patents

Information Patent Grant
Wavelength-dependent surface contour measurement system and method
- Patent number 6,636,310
- Issue date Oct 21, 2003
- Metroptic Technologies, Ltd.
- Shimshon Ben-Dov
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for optically measuring an object surface contour
- Patent number 6,094,269
- Issue date Jul 25, 2000
- Metroptic Technologies, Ltd.
- Shimshon Ben-Dove
- G06 - COMPUTING CALCULATING COUNTING

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