Metryx LLC

Organization

Providence, RI, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and method
- Patent number 9,995,783
- Issue date Jun 12, 2018
- Metryx Limited
- Adrian Kiermasz
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and device for determining information relating to the mass...
- Patent number 9,903,750
- Issue date Feb 27, 2018
- METRYX LTD.
- Robert John Wilby
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Semiconductor wafer processing methods and apparatus
- Patent number 9,818,658
- Issue date Nov 14, 2017
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement apparatus and method
- Patent number 9,423,447
- Issue date Aug 23, 2016
- Metryx Limited
- Adrian Kiermasz
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer monitoring apparatus and method
- Patent number 9,349,624
- Issue date May 24, 2016
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer metrology apparatus and method
- Patent number 9,310,244
- Issue date Apr 12, 2016
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer weight metrology apparatus
- Patent number 9,228,886
- Issue date Jan 5, 2016
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer metrology apparatus and method
- Patent number 8,683,880
- Issue date Apr 1, 2014
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling semiconductor device fabrication
- Patent number 8,594,827
- Issue date Nov 26, 2013
- Metryx Limited
- Adrian Kiermasz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of controlling semiconductor device fabrication
- Patent number 8,364,302
- Issue date Jan 29, 2013
- Metryx Limited
- Adrian Kiermasz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor wafer metrology apparatus and method
- Patent number 8,357,548
- Issue date Jan 22, 2013
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 8,200,447
- Issue date Jun 12, 2012
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 8,200,353
- Issue date Jun 12, 2012
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus
- Patent number 7,892,863
- Issue date Feb 22, 2011
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating parameters of layers deposit...
- Patent number 7,340,372
- Issue date Mar 4, 2008
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating semiconductors wafer
- Patent number 7,020,577
- Issue date Mar 28, 2006
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR CHANGING THE TEMPERATURE OF A WAFER
- Publication number 20240347352
- Publication date Oct 17, 2024
- METRYX LTD.
- Gregor Robert ELLIOTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS COMPRISING A WEIGHING DEVICE
- Publication number 20240210232
- Publication date Jun 27, 2024
- METRYX LTD.
- Sam OWENS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF A SEMICONDU...
- Publication number 20220034708
- Publication date Feb 3, 2022
- METRYX LIMITED
- Gregor ELLIOTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER MASS METROLOGY APPARATUS AND SEMICONDUCTOR WAFE...
- Publication number 20210175102
- Publication date Jun 10, 2021
- METRYX LIMITED
- Gregor ELLIOTT
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER WEIGHING APPARATUS AND METHODS
- Publication number 20170115158
- Publication date Apr 27, 2017
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER PROCESSING METHODS AND APPARATUS
- Publication number 20170005019
- Publication date Jan 5, 2017
- METRYX LIMITED
- Robert John WILBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPARATUS AND METHOD
- Publication number 20160306004
- Publication date Oct 20, 2016
- METRYX LIMITED
- Adrian KIERMASZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING INFORMATION RELATING TO THE MASS...
- Publication number 20160195424
- Publication date Jul 7, 2016
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
Measurement Apparatus and Method
- Publication number 20140015557
- Publication date Jan 16, 2014
- METRYX LIMITED
- Adrian Kiermasz
- C30 - CRYSTAL GROWTH
Information Patent Application
Method of Controlling Semiconductor Device Fabrication
- Publication number 20130149800
- Publication date Jun 13, 2013
- METRYX LIMITED
- Adrian KIERMASZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Wafer Metrology Apparatus
- Publication number 20130118816
- Publication date May 16, 2013
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
85829822 - METIOR
- Serial number 85829822
- Registration number 4541634
- Filing date Jan 23, 2013
- Metryx Limited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85493118 - METRYX
- Serial number 85493118
- Registration number 4211618
- Filing date Dec 12, 2011
- Metryx LLC
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Measurement apparatus and method

Method and device for determining information relating to the mass...

Semiconductor wafer processing methods and apparatus

Measurement apparatus and method

Semiconductor wafer monitoring apparatus and method

Semiconductor wafer metrology apparatus and method

Semiconductor wafer weight metrology apparatus

Semiconductor wafer metrology apparatus and method

Method of controlling semiconductor device fabrication

Method of controlling semiconductor device fabrication

Semiconductor wafer metrology apparatus and method

Measuring apparatus

Measuring apparatus

Measuring apparatus

Apparatus and method for investigating parameters of layers deposit...

Apparatus and method for investigating semiconductors wafer

Patents Applicationslast 30 patents

DEVICE FOR CHANGING THE TEMPERATURE OF A WAFER

APPARATUS COMPRISING A WEIGHING DEVICE

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF A SEMICONDU...

SEMICONDUCTOR WAFER MASS METROLOGY APPARATUS AND SEMICONDUCTOR WAFE...

SEMICONDUCTOR WAFER WEIGHING APPARATUS AND METHODS

SEMICONDUCTOR WAFER PROCESSING METHODS AND APPARATUS

MEASUREMENT APPARATUS AND METHOD

METHOD AND DEVICE FOR DETERMINING INFORMATION RELATING TO THE MASS...

Measurement Apparatus and Method

Method of Controlling Semiconductor Device Fabrication

Semiconductor Wafer Metrology Apparatus

Trademarklast 30 trademarks

85829822 - METIOR

85493118 - METRYX