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Mettler-Toledo Instruments (Shanghai) Co. Ltd

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  • Shanghai, CN
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    POWER ON/OFF CONTROL CIRCUIT AND ELECTRONIC DEVICE
    • Publication number 20240258909
    • Publication date Aug 1, 2024
    • Mettler-Toledo Instruments (Shanghai) Co., Ltd.
    • Yingzhen Tong
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Application

    ELECTRODE HOLDER
    • Publication number 20240175840
    • Publication date May 30, 2024
    • Mettler-Toledo Instruments (Shanghai) Co., Ltd.
    • Patrick Kurth
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING DEVICE WITH A SEALING STRUCTURE
    • Publication number 20240053275
    • Publication date Feb 15, 2024
    • Mettler-Toledo Instruments (Shanghai) Co., Ltd.
    • Zhongjun Wang
    • G01 - MEASURING TESTING
  • Information Patent Application

    LOW-POWER ELECTRONIC PIPETTE
    • Publication number 20210405080
    • Publication date Dec 30, 2021
    • Mettler-Toledo Instruments (Shanghai) Co. Ltd
    • Jin Tang
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTERNAL CALIBRATION MECHANISM FOR A WEIGH MODULE
    • Publication number 20210199491
    • Publication date Jul 1, 2021
    • Mettler Toledo Instrument (Shanghai) Company Limited
    • Baohui Liu
    • G01 - MEASURING TESTING
  • Information Patent Application

    WEIGH MODULE
    • Publication number 20210199487
    • Publication date Jul 1, 2021
    • Mettler Toledo Instrument (Shanghai) Company Limited
    • Chao Wu
    • G01 - MEASURING TESTING
  • Information Patent Application

    WEIGHING SENSOR AND ELECTRONIC BALANCE
    • Publication number 20200386606
    • Publication date Dec 10, 2020
    • Mettler Toledo Instrument (Shanghai) Company Limited
    • Chao Wu
    • G01 - MEASURING TESTING
  • Information Patent Application

    WEIGHING SENSOR AND LEVER
    • Publication number 20200355544
    • Publication date Nov 12, 2020
    • Mettler Toledo Instrument (Shanghai) Company Limited
    • Chao Wu
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL STRUCTURE
    • Publication number 20190355870
    • Publication date Nov 21, 2019
    • Mettler-Toledo Instruments (Shanghai) Co. Ltd
    • Changlin Wang
    • H01 - BASIC ELECTRIC ELEMENTS

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