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METTLER-TOLEDO INTERNATIONAL INC
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GREIFENSEE, CH
Ticker Symbols
NYSE:MTD
LABORATORY ANALYTICAL INSTRUMENTS
Business Address
1900 POLARIS PARKWAY COLUMBUS OH 43240 6144384511
Mailing Address
1900 POLARIS PARKWAY COLUMBUS OH 43240
State Location
OH
State of Incorporation
DE
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Patents Grants
last 30 patents
Information
Patent Grant
Weighing apparatus
Patent number
D1053034
Issue date
Dec 3, 2024
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
Youyi Wu
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Weighing apparatus
Patent number
D1050919
Issue date
Nov 12, 2024
Mettler-Toledo GmbH
Baozhou Sun
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Weighing apparatus
Patent number
D1050920
Issue date
Nov 12, 2024
Mettler-Toledo GmbH
Baozhou Sun
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Weighing apparatus
Patent number
D1050921
Issue date
Nov 12, 2024
Mettler-Toledo GmbH
Baozhou Sun
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Printer housing
Patent number
D1048172
Issue date
Oct 22, 2024
Mettler-Toledo (Changzhou) Measurement Technology Ltd.
Yinxiu Zhang
D18 - Printing and office machinery
Information
Patent Grant
Pipette controller
Patent number
D1045125
Issue date
Oct 1, 2024
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
Bo Zhao
D24 - Medical and laboratory equipment
Information
Patent Grant
Weighing device
Patent number
D1043390
Issue date
Sep 24, 2024
Mettler-Toledo (Changzhou) Precision Instrument Co., Ltd.
You Yi Wu
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Method for measuring energy efficiency of a quantitative weighing d...
Patent number
12,098,948
Issue date
Sep 24, 2024
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
Shenhui Wang
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Method and apparatus for managing measurement device based on block...
Patent number
12,056,761
Issue date
Aug 6, 2024
Mettler-Toledo (Chagzhou) Precision Instruments Ltd.
JianQiang Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hysteresis compensation method for a weighing device
Patent number
12,055,431
Issue date
Aug 6, 2024
Mettler-Toledo (Changzhou) Measurement Technology Ltd.
Song Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Weighing device
Patent number
D1030530
Issue date
Jun 11, 2024
Mettler-Toledo (Changzhou) Precision Instrument Co., Ltd.
You Yi Wu
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Weighing device
Patent number
D1030529
Issue date
Jun 11, 2024
Mettler-Toledo (Changzhou) Precision Instrument Co., Ltd.
You Yi Wu
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Status detection method and apparatus for load cell
Patent number
12,007,270
Issue date
Jun 11, 2024
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
JianWei Wu
G01 - MEASURING TESTING
Information
Patent Grant
Explosion-resistant weighing display
Patent number
D1023806
Issue date
Apr 23, 2024
Mettler-Toledo (Changzhou) Measurement Technology Ltd.
YinXiu Zhang
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Calibration device for weighing system
Patent number
11,965,772
Issue date
Apr 23, 2024
Mettler Toledo Precision Instrument Company Limited
Haitao Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method for real-time processing of a detection signal and a detector
Patent number
11,967,982
Issue date
Apr 23, 2024
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
ShenHui Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High precision weighing system and weighing method, thermogravimetr...
Patent number
11,959,934
Issue date
Apr 16, 2024
Mettler Toledo Precision Instrument Company Limited
Lei Xu
G01 - MEASURING TESTING
Information
Patent Grant
Linear compensation apparatus and weighing system for accurate weig...
Patent number
11,885,666
Issue date
Jan 30, 2024
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
Jinjie Cai
G01 - MEASURING TESTING
Information
Patent Grant
Weighing method with automatic micro-calibration function
Patent number
11,879,770
Issue date
Jan 23, 2024
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Zhengwei Ji
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for measuring interference in a checkweighing device
Patent number
11,846,539
Issue date
Dec 19, 2023
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Shenhui Wang
G01 - MEASURING TESTING
Information
Patent Grant
Strain gauge insulated against moisture penetration and method of m...
Patent number
11,841,282
Issue date
Dec 12, 2023
Mettler-Toledo (Changzhou) Precision Instrument Co. Ltd.
XiangQun Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Pipette controller
Patent number
D1000633
Issue date
Oct 3, 2023
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
Bo Zhao
D24 - Medical and laboratory equipment
Information
Patent Grant
Key determination method for metal key
Patent number
11,762,480
Issue date
Sep 19, 2023
Mettler-Toledo (Changzhou) Measurement Technology Ltd.
Jingke Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for managing measurement device based on block...
Patent number
11,748,336
Issue date
Sep 5, 2023
METTLER-TOLEDO (CHANGZHOU) PRECISION INSTRUMENTS LTD.
Jean-Christophe Emery
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High-precision weighing module with reduced thermal gradient
Patent number
11,733,084
Issue date
Aug 22, 2023
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Dandan Huang
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic power consumption management and wake-up method and applica...
Patent number
11,669,147
Issue date
Jun 6, 2023
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
ShenJian Qian
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Weighing scale with pendant weigh platform
Patent number
D984916
Issue date
May 2, 2023
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
Naiging Cao
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Detection system using x-rays
Patent number
D980096
Issue date
Mar 7, 2023
Mettler-Toledo (Changzhou) Measurement Technology Ltd.
Peng Jiang
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Method for adjusting parameters of a device having a weighing sensor
Patent number
11,573,120
Issue date
Feb 7, 2023
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
Jianwei Wu
G01 - MEASURING TESTING
Information
Patent Grant
Weighing method and storage medium thereof
Patent number
11,519,777
Issue date
Dec 6, 2022
Mettler Toledo Precision Instrument Company Limited
Jianwei Wu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VOLUME MEASUREMENT METHOD AND AN APPARATUS BASED ON A DEPTH CAMERA,...
Publication number
20240362812
Publication date
Oct 31, 2024
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Conghan Cao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FILTERING METHOD AND FILTERING CONTROL APPARATUS FOR LOAD CELL
Publication number
20240280400
Publication date
Aug 22, 2024
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Shenhui Wang
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED HIGH-PRECISION WEIGHING MODULE
Publication number
20240263992
Publication date
Aug 8, 2024
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Dandan Huang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING AND REMOVING PERSONNEL INTERFERENCE WHILE MEAS...
Publication number
20240233135
Publication date
Jul 11, 2024
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Conghan Cao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MECHANICAL APPARATUS LEVELLING MECHANISM AND LEVELLING METHOD THEREFOR
Publication number
20240110660
Publication date
Apr 4, 2024
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Shaowen Zheng
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
DIGITAL LOAD CELL WITH REDUNDANCY DESIGN
Publication number
20240102849
Publication date
Mar 28, 2024
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Ying Zhang
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL LOAD CELL AND WEIGHING SYSTEM
Publication number
20240077352
Publication date
Mar 7, 2024
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Ying Zhang
G01 - MEASURING TESTING
Information
Patent Application
WEIGHT STABILITY CONTROL METHOD FOR DEADWEIGHT FORCE STANDARD MACHINE
Publication number
20240053189
Publication date
Feb 15, 2024
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Hanqing Xu
G01 - MEASURING TESTING
Information
Patent Application
HANGING SCALE SENSOR APPARATUS AND A HANGING SCALE
Publication number
20240019294
Publication date
Jan 18, 2024
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Naiqing Cao
G01 - MEASURING TESTING
Information
Patent Application
LOAD CELL WITH ROBERVAL STRUCTURE HAVING ANTI-OFFSET FUNCTION, AND...
Publication number
20240003761
Publication date
Jan 4, 2024
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Hongzhi Lin
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REAL-TIME PROCESSING OF A DETECTION SIGNAL AND A DETECTOR
Publication number
20230396276
Publication date
Dec 7, 2023
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
ShenHui Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
METHOD AND SYSTEM FOR ECCENTRIC LOAD ERROR CORRECTION
Publication number
20230266158
Publication date
Aug 24, 2023
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Shenhui Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONFIGURING A CALIBRATION MECHANISM AND FORCE SENSOR THE...
Publication number
20230228615
Publication date
Jul 20, 2023
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Lei Xu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING DISCHARGE FLOW RATE IN A LOSS-IN-WEIGHT SCALE
Publication number
20230139042
Publication date
May 4, 2023
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Shenhui Wang
G01 - MEASURING TESTING
Information
Patent Application
KEY DETERMINATION METHOD FOR METAL KEY
Publication number
20230033782
Publication date
Feb 2, 2023
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Jingke Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HYSTERESIS COMPENSATION METHOD FOR A WEIGHING DEVICE
Publication number
20220268622
Publication date
Aug 25, 2022
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Song Zhang
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF WEIGHING USING OBJECT RECOGNITION AND DEVICE THEREFOR
Publication number
20220260410
Publication date
Aug 18, 2022
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Song Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WEIGHING SYSTEM AND WEIGHING METHOD WITH OBJECT RECOGNITION
Publication number
20220252448
Publication date
Aug 11, 2022
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Song Zhang
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC WEIGHING DEVICE
Publication number
20220217510
Publication date
Jul 7, 2022
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
Dake Tan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TELESCOPING ELECTRIC PIPETTE CONTROLLER
Publication number
20220203348
Publication date
Jun 30, 2022
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Bo Zhao
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REAL-TIME PROCESSING OF A DETECTION SIGNAL AND A DETECTOR
Publication number
20220173758
Publication date
Jun 2, 2022
Mettler-Toledo (Changzhou) Measurement Technology Co., Ltd.
ShenHui Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
STATUS DETECTION METHOD AND APPARATUS FOR LOAD CELL
Publication number
20220099480
Publication date
Mar 31, 2022
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
JianWei Wu
G01 - MEASURING TESTING
Information
Patent Application
LINEAR COMPENSATION APPARATUS AND WEIGHING SYSTEM FOR ACCURATE WEIG...
Publication number
20220074787
Publication date
Mar 10, 2022
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
Jinjie Cai
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING ENERGY EFFICIENCY OF A QUANTITATIVE WEIGHING D...
Publication number
20220057253
Publication date
Feb 24, 2022
Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd.
Shenhui Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DIAGNOSING WEIGHING SYSTEM
Publication number
20210381881
Publication date
Dec 9, 2021
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Jianqiang Yang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING INTERFERENCE IN A CHECKWEIGHING DEVICE
Publication number
20210372847
Publication date
Dec 2, 2021
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Shenhui Wang
G01 - MEASURING TESTING
Information
Patent Application
HIGH-PRECISION WEIGHING MODULE WITH REDUCED THERMAL GRADIENT
Publication number
20210348963
Publication date
Nov 11, 2021
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Dandan Huang
G01 - MEASURING TESTING
Information
Patent Application
WEIGHING METHOD WITH AUTOMATIC MICRO-CALIBRATION FUNCTION
Publication number
20210293609
Publication date
Sep 23, 2021
Mettler-Toledo (Changzhou) Precision Instruments Ltd.
Zhengwei Ji
G01 - MEASURING TESTING
Information
Patent Application
HIGH PRECISION WEIGHING SYSTEM AND WEIGHING METHOD, THERMOGRAVIMETR...
Publication number
20210293682
Publication date
Sep 23, 2021
Mettler Toledo Precision Instrument Company Limited
Lei Xu
G01 - MEASURING TESTING
Information
Patent Application
STRAIN GAUGE INSULATED AGAINST MOISTURE PENETRATION AND METHOD OF M...
Publication number
20210262873
Publication date
Aug 26, 2021
Mettler-Toledo (Changzhou) Precision Instrument Co. Ltd
XiangQun Zhu
G01 - MEASURING TESTING
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