MFI TECHNOLOGIES INCORPORATED

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Mount Sinai, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for sub-micron imaging and probing on probe st...
- Patent number 6,377,066
- Issue date Apr 23, 2002
- MFI Technologies Corporation
- Greg E. Bridges
- G01 - MEASURING TESTING
Information Patent Grant
Scanning force microscope probe cantilever with reflective structure
- Patent number 6,298,715
- Issue date Oct 9, 2001
- MFI Technologies Corporation
- Douglas J. Thomson
- B82 - NANO-TECHNOLOGY

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Trademarklast 30 trademarks

Information Trademark
97373560 - FUR IS FAMILY
- Serial number 97373560
- Filing date Apr 21, 2022
- MFI TECHNOLOGIES INCORPORATED
- 36 - Insurance