Micro-Epsilon Messetechnik GmbH

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Orgenburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for calibrating a thickness gauge
- Patent number 8,554,503
- Issue date Oct 8, 2013
- Micro-Epsilon Messetechnik GmbH
- Günter Schallmoser
- G01 - MEASURING TESTING