MICRO-EPSILON MESSTECHNIK GMBH & CO. KG

Organization

Ortenburg, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Device for determining the thickness of an object
- Patent number 11,828,583
- Issue date Nov 28, 2023
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Gerhard Kirschner
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Reluctance actuator
- Patent number 11,614,614
- Issue date Mar 28, 2023
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Georg Schitter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and sensor for contactless distance and/or position determin...
- Patent number 11,333,481
- Issue date May 17, 2022
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Reinhold Hoenicka
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring the thickness of coatings
- Patent number 11,313,664
- Issue date Apr 26, 2022
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Christian Ziep
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for optically measuring the surface of a measurem...
- Patent number 11,125,550
- Issue date Sep 21, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Hannes Loferer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical plug connector
- Patent number 11,095,061
- Issue date Aug 17, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Benedikt Biller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reference plate and method for calibrating and/or checking a deflec...
- Patent number 11,092,432
- Issue date Aug 17, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Stephan Zweckinger
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring the geometry of the inner wall of bores and co...
- Patent number 10,890,435
- Issue date Jan 12, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Juergen Haas
- G01 - MEASURING TESTING
Information Patent Grant
Linearization circuit and method for linearizing a measurement signal
- Patent number 10,700,698
- Issue date Jun 30, 2020
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Harald Haas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor arrangement and method for determining a position and/or a c...
- Patent number 10,502,591
- Issue date Dec 10, 2019
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Felix Mednikov
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and method for producing the sensor
- Patent number 10,240,908
- Issue date Mar 26, 2019
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Reinhold Hoenicka
- G01 - MEASURING TESTING
Information Patent Grant
Method for thickness measurement on measurement objects and device...
- Patent number 10,234,274
- Issue date Mar 19, 2019
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Herbert Fuellmeier
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring the width and thickness of a flat o...
- Patent number 10,184,784
- Issue date Jan 22, 2019
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Achim Sonntag
- G01 - MEASURING TESTING
Information Patent Grant
Inductive sensor comprising integrated soft magnetic layer and meth...
- Patent number 10,060,762
- Issue date Aug 28, 2018
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Christian Pfaffinger
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor comprising integrated heating element
- Patent number 10,036,657
- Issue date Jul 31, 2018
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Norbert Reindl
- G01 - MEASURING TESTING
Information Patent Grant
Circuit arrangement and method for controlling a displacement measu...
- Patent number 10,001,388
- Issue date Jun 19, 2018
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Franz Hrubes
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor
- Patent number 9,677,947
- Issue date Jun 13, 2017
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Reinhold Hoenicka
- G01 - MEASURING TESTING
Information Patent Grant
Bushing of an electrical conductor
- Patent number 9,672,962
- Issue date Jun 6, 2017
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Alfons Meilhamer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for sensing magnetic fields
- Patent number 9,574,865
- Issue date Feb 21, 2017
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Christian Pfaffinger
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and sensor element
- Patent number 9,347,800
- Issue date May 24, 2016
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Torsten Thelemann
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the thickness of a measurement o...
- Patent number 9,335,145
- Issue date May 10, 2016
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Achim Sonntag
- G01 - MEASURING TESTING
Information Patent Grant
Circuit system and method for evaluating a sensor
- Patent number 9,222,805
- Issue date Dec 29, 2015
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Christian Pfaffinger
- G01 - MEASURING TESTING
Information Patent Grant
Sensor comprising a multi-layered ceramic substrate and method for...
- Patent number 9,144,155
- Issue date Sep 22, 2015
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Sabine Schmideder
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Contactless distance measuring sensor and method for contactless di...
- Patent number 9,052,178
- Issue date Jun 9, 2015
- Burkert Werke GmbH
- Kersten Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 9,018,949
- Issue date Apr 28, 2015
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Reinhold Hoenicka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Position sensor
- Patent number 8,941,389
- Issue date Jan 27, 2015
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Franz Hrubes
- G01 - MEASURING TESTING
Information Patent Grant
Sensor in which the sensor element is part of the sensor housing
- Patent number 8,833,160
- Issue date Sep 16, 2014
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Reinhold Hoenicka
- G01 - MEASURING TESTING
Information Patent Grant
Sensor arrangement and method for determining the position and/or c...
- Patent number 8,736,255
- Issue date May 27, 2014
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Vladislav Mednikov
- G01 - MEASURING TESTING
Information Patent Grant
Method and sensor arrangement for determining the position and/or c...
- Patent number 8,476,896
- Issue date Jul 2, 2013
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Vladislav Mednikov
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating for temperature related measurement errors...
- Patent number 8,248,598
- Issue date Aug 21, 2012
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Reinhold Hoenicka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR AND SYSTEM COMPRISING A SENSOR AND A FASTENING DEVICE
- Publication number 20240318987
- Publication date Sep 26, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Stefan STELZL
- G01 - MEASURING TESTING
Information Patent Application
COIL ASSEMBLY
- Publication number 20240312698
- Publication date Sep 19, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Christian ECKE
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Measuring a Measurement Object
- Publication number 20240271928
- Publication date Aug 15, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Gerhard KIRSCHNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MEASUREMENT SYSTEM FOR CARRYING OUT AND/OR DISPLAYING A...
- Publication number 20240241623
- Publication date Jul 18, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTUATOR-SENSOR SYSTEM AND FAST STEERING MIRROR (FSM) HAVING AN ACT...
- Publication number 20240231076
- Publication date Jul 11, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Harald HAAS
- G01 - MEASURING TESTING
Information Patent Application
ACTUATOR-SENSOR SYSTEM AND FAST STEERING MIRROR (FSM) HAVING AN ACT...
- Publication number 20240134183
- Publication date Apr 25, 2024
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Harald HAAS
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC ACTUATOR
- Publication number 20230377788
- Publication date Nov 23, 2023
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Tobias Schopf
- G02 - OPTICS
Information Patent Application
DEVICE FOR GUIDING A LINE THROUGH A WALL IN A PRESSURE-TIGHT MANNER...
- Publication number 20230366489
- Publication date Nov 16, 2023
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Stefan Stelzl
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
SENSOR SYSTEM AND METHOD FOR OPERATING A SENSOR SYSTEM
- Publication number 20230188009
- Publication date Jun 15, 2023
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Michael KURAN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY MEASURING AN OBJECT HAVING A SPECUL...
- Publication number 20230083039
- Publication date Mar 16, 2023
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Reiner KICKINGEREDER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR DETERMINING THE THICKNESS OF AN OBJECT
- Publication number 20220042788
- Publication date Feb 10, 2022
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Gerhard KIRSCHNER
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Device for Measuring the Thickness of Coatings
- Publication number 20210372765
- Publication date Dec 2, 2021
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Christian Ziep
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...
- Publication number 20210364277
- Publication date Nov 25, 2021
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLACEMENT SENSOR OPERATING WITHOUT CONTACT
- Publication number 20200309574
- Publication date Oct 1, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Thomas WISSPEINTNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...
- Publication number 20200158498
- Publication date May 21, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G01 - MEASURING TESTING
Information Patent Application
RELUCTANCE ACTUATOR
- Publication number 20200041781
- Publication date Feb 6, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Georg SCHITTER
- G02 - OPTICS
Information Patent Application
LINEARIZATION CIRCUIT AND METHOD FOR LINEARIZING A MEASUREMENT SIGNAL
- Publication number 20200021306
- Publication date Jan 16, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Harald HAAS
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING THE GEOMETRY OF THE INNER WALL OF BORES AND CO...
- Publication number 20190271536
- Publication date Sep 5, 2019
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Juergen HAAS
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...
- Publication number 20190265026
- Publication date Aug 29, 2019
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Stephan ZWECKINGER
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL PLUG CONNECTOR
- Publication number 20190190181
- Publication date Jun 20, 2019
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Benedikt BILLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR AND SENSOR ELEMENT
- Publication number 20190003857
- Publication date Jan 3, 2019
- Micro-Epsilon Messtechnik GmbH & Co., KG
- Josef HACKL
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ARRANGEMENT AND METHOD FOR DETERMINING A POSITION AND/OR A C...
- Publication number 20180313666
- Publication date Nov 1, 2018
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Felix Mednikov
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND SENSOR FOR CONTACTLESS DISTANCE AND/OR POSITION DETERMIN...
- Publication number 20180245906
- Publication date Aug 30, 2018
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Reinhold HOENICKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INLINE TRACE ANALYSIS OF A LIQUID
- Publication number 20180011005
- Publication date Jan 11, 2018
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Gerhard Kirschner
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT ARRANGEMENT AND METHOD FOR CONTROLLING A DISPLACEMENT MEASU...
- Publication number 20170248443
- Publication date Aug 31, 2017
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Franz Hrubes
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING THE WIDTH AND THICKNESS OF A FLAT O...
- Publication number 20170205225
- Publication date Jul 20, 2017
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Achim Sonntag
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE...
- Publication number 20160252343
- Publication date Sep 1, 2016
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Herbert Fuellmeier
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE SENSOR COMPRISING INTEGRATED SOFT MAGNETIC LAYER AND METH...
- Publication number 20160209240
- Publication date Jul 21, 2016
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Christian Pfaffinger
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR COMPRISING INTEGRATED HEATING ELEMENT
- Publication number 20150300844
- Publication date Oct 22, 2015
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Norbert Reindl
- G01 - MEASURING TESTING
Information Patent Application
Sensor, System Having A Sensor and A Measurement Object, and Method...
- Publication number 20140198824
- Publication date Jul 17, 2014
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Josef Nagl
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
79162811 - µE MICRO-EPSILON
- Serial number 79162811
- Registration number 5019628
- Filing date Aug 6, 2014
- MICRO-EPSILON-MESSTECHNIK GmbH & Co. KG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79055370 - MICROEPSILON
- Serial number 79055370
- Registration number 3669513
- Filing date Jan 22, 2008
- MICRO-EPSILON-MESSTECHNIK GmbH & Co. KG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73182288 - µE
- Serial number 73182288
- Registration number 1164425
- Filing date Aug 16, 1978
- Micro-Epsilon Messtechnik GmbH & Co., KG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

MICRO-EPSILON MESSTECHNIK GMBH & CO. KG

Organization

Patents Grantslast 30 patents

Device for determining the thickness of an object

Reluctance actuator

Device and sensor for contactless distance and/or position determin...

Device for measuring the thickness of coatings

Method and device for optically measuring the surface of a measurem...

Electrical plug connector

Reference plate and method for calibrating and/or checking a deflec...

Device for measuring the geometry of the inner wall of bores and co...

Linearization circuit and method for linearizing a measurement signal

Sensor arrangement and method for determining a position and/or a c...

Sensor and method for producing the sensor

Method for thickness measurement on measurement objects and device...

Device and method for measuring the width and thickness of a flat o...

Inductive sensor comprising integrated soft magnetic layer and meth...

Capacitive sensor comprising integrated heating element

Circuit arrangement and method for controlling a displacement measu...

Temperature sensor

Bushing of an electrical conductor

Method and apparatus for sensing magnetic fields

Sensor and sensor element

Apparatus and method for measuring the thickness of a measurement o...

Circuit system and method for evaluating a sensor

Sensor comprising a multi-layered ceramic substrate and method for...

Contactless distance measuring sensor and method for contactless di...

Sensor

Position sensor

Sensor in which the sensor element is part of the sensor housing

Sensor arrangement and method for determining the position and/or c...

Method and sensor arrangement for determining the position and/or c...

Method for compensating for temperature related measurement errors...

Patents Applicationslast 30 patents

SENSOR AND SYSTEM COMPRISING A SENSOR AND A FASTENING DEVICE

COIL ASSEMBLY

Method and Device for Measuring a Measurement Object

METHOD AND MEASUREMENT SYSTEM FOR CARRYING OUT AND/OR DISPLAYING A...

ACTUATOR-SENSOR SYSTEM AND FAST STEERING MIRROR (FSM) HAVING AN ACT...

ACTUATOR-SENSOR SYSTEM AND FAST STEERING MIRROR (FSM) HAVING AN ACT...

ELECTROMAGNETIC ACTUATOR

DEVICE FOR GUIDING A LINE THROUGH A WALL IN A PRESSURE-TIGHT MANNER...

SENSOR SYSTEM AND METHOD FOR OPERATING A SENSOR SYSTEM

METHOD AND SYSTEM FOR OPTICALLY MEASURING AN OBJECT HAVING A SPECUL...

DEVICE FOR DETERMINING THE THICKNESS OF AN OBJECT

Device for Measuring the Thickness of Coatings

METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...

DISPLACEMENT SENSOR OPERATING WITHOUT CONTACT

METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...

RELUCTANCE ACTUATOR

LINEARIZATION CIRCUIT AND METHOD FOR LINEARIZING A MEASUREMENT SIGNAL

DEVICE FOR MEASURING THE GEOMETRY OF THE INNER WALL OF BORES AND CO...

REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...

ELECTRICAL PLUG CONNECTOR

SENSOR AND SENSOR ELEMENT

SENSOR ARRANGEMENT AND METHOD FOR DETERMINING A POSITION AND/OR A C...

DEVICE AND SENSOR FOR CONTACTLESS DISTANCE AND/OR POSITION DETERMIN...

APPARATUS FOR INLINE TRACE ANALYSIS OF A LIQUID

CIRCUIT ARRANGEMENT AND METHOD FOR CONTROLLING A DISPLACEMENT MEASU...

DEVICE AND METHOD FOR MEASURING THE WIDTH AND THICKNESS OF A FLAT O...

METHOD FOR THICKNESS MEASUREMENT ON MEASUREMENT OBJECTS AND DEVICE...

INDUCTIVE SENSOR COMPRISING INTEGRATED SOFT MAGNETIC LAYER AND METH...

CAPACITIVE SENSOR COMPRISING INTEGRATED HEATING ELEMENT

Sensor, System Having A Sensor and A Measurement Object, and Method...

Trademarklast 30 trademarks

79162811 - µE MICRO-EPSILON

79055370 - MICROEPSILON

73182288 - µE