MICRO-EPSILON OPTRONIC GMBH

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Dresden-Langebruck, DE

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Patents Grantslast 30 patents

Information Patent Grant
Optical positioning aid for a distance sensor, distance measuring s...
- Patent number 12,181,268
- Issue date Dec 31, 2024
- Micro-Epsilon Optronic GmbH
- Torsten Stautmeister
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 9,851,251
- Issue date Dec 26, 2017
- MICRO-EPSILON Optronic GmbH
- Tobias Otto
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system for determining distances
- Patent number 9,453,728
- Issue date Sep 27, 2016
- MICRO-EPSILON Optronic GmbH
- Torsten Stautmeister
- G01 - MEASURING TESTING
Information Patent Grant
Spatial filter measuring arrangement, device, and associated method...
- Patent number 8,987,657
- Issue date Mar 24, 2015
- Micro-Epsilon Optronic GmbH
- Martin Degner
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for non-contacting measurement of a distance and/...
- Patent number 8,928,862
- Issue date Jan 6, 2015
- Micro-Epsilon Optronic GmbH
- Tobias Otto
- G01 - MEASURING TESTING
Information Patent Grant
Sensor and method for optically measuring a distance, a position, a...
- Patent number 8,810,778
- Issue date Aug 19, 2014
- Micro-Epsilon Optronic GmbH
- Torsten Stautmeister
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT
- Publication number 20250116506
- Publication date Apr 10, 2025
- MICRO-EPSILON OPTRONIC GMBH
- Tobias OTTO
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, DISTANCE MEASURING SYSTEM, AND METHOD FOR OPERATING A...
- Publication number 20240255348
- Publication date Aug 1, 2024
- MICRO-EPSILON OPTRONIC GMBH
- Tobias Otto
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISTANCE SENSOR WITH CLOSED-LOOP EXPOSURE CONTROL AND CORRE...
- Publication number 20230243637
- Publication date Aug 3, 2023
- MICRO-EPSILON OPTRONIC GMBH
- Steffen Prusseit
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL POSITIONING AID FOR A DISTANCE SENSOR, DISTANCE MEASURING S...
- Publication number 20230111872
- Publication date Apr 13, 2023
- MICRO-EPSILON OPTRONIC GMBH
- Torsten Stautmeister
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM FOR OPTICAL MEASUREMENT
- Publication number 20220155445
- Publication date May 19, 2022
- MICRO-EPSILON OPTRONIC GMBH
- Lars TOBESCHAT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING A CURVED WAVEFRONT USING AT LEAS...
- Publication number 20200370964
- Publication date Nov 26, 2020
- MICRO-EPSILON OPTRONIC GMBH
- Georg Schitter
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20170067780
- Publication date Mar 9, 2017
- MICRO-EPSILON OPTRONIC GMBH
- Tobias Otto
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT SYSTEM FOR DETERMINING DISTANCES
- Publication number 20130148099
- Publication date Jun 13, 2013
- MICRO-EPSILON OPTRONIC GMBH
- Torsten Stautmeister
- G01 - MEASURING TESTING
Information Patent Application
Microarray-Based Spatial Filter
- Publication number 20130001401
- Publication date Jan 3, 2013
- MICRO-EPSILON OPTRONIC GMBH
- Martin Degner
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR NON-CONTACTING MEASUREMENT OF A DISTANCE AND/...
- Publication number 20120038900
- Publication date Feb 16, 2012
- MICRO-EPSILON OPTRONIC GMBH
- Tobias Otto
- G01 - MEASURING TESTING

MICRO-EPSILON OPTRONIC GMBH

Organization

Patents Grantslast 30 patents

Optical positioning aid for a distance sensor, distance measuring s...

Spectrometer

Optical measurement system for determining distances

Spatial filter measuring arrangement, device, and associated method...

Device and method for non-contacting measurement of a distance and/...

Sensor and method for optically measuring a distance, a position, a...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR CONFOCAL-CHROMATIC LINE DISTANCE MEASUREMENT

SPECTROMETER, DISTANCE MEASURING SYSTEM, AND METHOD FOR OPERATING A...

OPTICAL DISTANCE SENSOR WITH CLOSED-LOOP EXPOSURE CONTROL AND CORRE...

OPTICAL POSITIONING AID FOR A DISTANCE SENSOR, DISTANCE MEASURING S...

MEASUREMENT SYSTEM FOR OPTICAL MEASUREMENT

METHOD AND APPARATUS FOR MEASURING A CURVED WAVEFRONT USING AT LEAS...

SPECTROMETER

OPTICAL MEASUREMENT SYSTEM FOR DETERMINING DISTANCES

Microarray-Based Spatial Filter

DEVICE AND METHOD FOR NON-CONTACTING MEASUREMENT OF A DISTANCE AND/...

Trademarklast 30 trademarks