Micronics Japan Co., Ltd.

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Musashino-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Computer program and method for generating wire routing pattern
- Patent number 8,365,130
- Issue date Jan 29, 2013
- Micronics Japan Co., Ltd.
- Katsushi Mikuni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC carrie, IC socket and method for testing IC device
- Patent number 7,884,630
- Issue date Feb 8, 2011
- Micronics Japan Co., Ltd.
- Eichi Osato
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit substrate
- Patent number 7,800,384
- Issue date Sep 21, 2010
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer wiring board and method for testing the same
- Patent number 7,659,727
- Issue date Feb 9, 2010
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer wiring board and method for testing the same
- Patent number 7,656,166
- Issue date Feb 2, 2010
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit substrate
- Patent number 7,504,843
- Issue date Mar 17, 2009
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER PROGRAM AND METHOD FOR GENERATING WIRE ROUTING PATTERN
- Publication number 20120167032
- Publication date Jun 28, 2012
- Micronics Japan Co., Ltd.
- Katsushi Mikuni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE UNIT SUBSTRATE
- Publication number 20090128175
- Publication date May 21, 2009
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Application
Multilayer wiring board and method for testing the same
- Publication number 20080204037
- Publication date Aug 28, 2008
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Application
Multilayer wiring board and method for testing the same
- Publication number 20080204038
- Publication date Aug 28, 2008
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Application
Ic Carrier, Ic Socket and Method for Testing Ic Device
- Publication number 20080191723
- Publication date Aug 14, 2008
- Micronics Japan Co., Ltd.
- Eichi Osato
- G01 - MEASURING TESTING
Information Patent Application
Probe unit substrate
- Publication number 20080157794
- Publication date Jul 3, 2008
- Micronics Japan Co., Ltd.
- Yoshiyuki Fukami
- G01 - MEASURING TESTING

Trademarklast 30 trademarks