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KIRYAT ATIDIM TEL AVIV, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for perpendicular magnetic media metrology
Patent number
7,684,145
Issue date
Mar 23, 2010
MicroSense, LLC
William Van Drent
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC PROPERTY MEASURING SYSTEMS, METHODS FOR MEASURING MAGNETIC...
Publication number
20190295616
Publication date
Sep 26, 2019
Samsung Electronics Co., Ltd.
Eunsun NOH
H01 - BASIC ELECTRIC ELEMENTS
Trademark
last 30 trademarks
Information
Trademark
75352853 - MICROSENSE
Serial number
75352853
Filing date
Sep 8, 1997
MicroSense International, L.L.C.
10 - Surgical, medical, dental and veterinary apparatus and instruments, artificial limbs, eyes and teeth