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Alignment wafer
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Patent number 6,568,098
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Issue date May 27, 2003
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MicroTool, Inc.
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Gordon Haggott Beckhart
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H01 - BASIC ELECTRIC ELEMENTS
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Electronic level
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Patent number 6,526,668
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Issue date Mar 4, 2003
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MicroTool, Inc.
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Gordon Haggott Beckhart
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G01 - MEASURING TESTING
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Semiconductor alignment tool
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Patent number 6,307,211
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Issue date Oct 23, 2001
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MicroTool, Inc.
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Gordon Haggott Beckhart
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H01 - BASIC ELECTRIC ELEMENTS
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