MICROTRONIC AG

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Oensingen, CH

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for authorizing access to goods and/or services a...
- Patent number 10,134,220
- Issue date Nov 20, 2018
- MICROTRONIC AG
- Bernard Wahli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
- Patent number 9,791,309
- Issue date Oct 17, 2017
- Microtronic, Inc.
- Reiner G. Fenske
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for authorizing access to goods and/or services a...
- Patent number 9,704,147
- Issue date Jul 11, 2017
- MICROTRONIC AG
- Bernard Wahli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
- Patent number 9,004,838
- Issue date Apr 14, 2015
- Microtronic, Inc.
- Reiner G. Fenske
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
- Patent number 8,851,816
- Issue date Oct 7, 2014
- Microtronic, Inc.
- Reiner G. Fenske
- G01 - MEASURING TESTING
Information Patent Grant
Electroacoustic transducer with improved shock resistance
- Patent number 6,075,870
- Issue date Jun 13, 2000
- Microtronic B.V.
- Onno Geschiere
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR AUTHORIZING ACCESS TO GOODS AND/OR SERVICES A...
- Publication number 20170263072
- Publication date Sep 14, 2017
- MICROTRONIC AG
- Bernard Wahli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR AUTHORIZING ACCESS TO GOODS AND/OR SERVICES A...
- Publication number 20150278791
- Publication date Oct 1, 2015
- MICROTRONIC AG
- Bernard Wahli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, SYSTEM, AND METHODS FOR WEIGHING AND POSITIONING WAFERS
- Publication number 20150219486
- Publication date Aug 6, 2015
- MICROTRONIC, INC.
- Reiner G. FENSKE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR WAFER CHARACTERIZATION
- Publication number 20120255795
- Publication date Oct 11, 2012
- MICROTRONIC, INC.
- Reiner G. FENSKE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR WAFER CHARACTERIZATION
- Publication number 20120255794
- Publication date Oct 11, 2012
- MICROTRONIC, INC.
- Reiner G. FENSKE
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
73458283 - MICROTRONICS
- Serial number 73458283
- Registration number 1325528
- Filing date Dec 23, 1983
- Microtronics, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73268434 - TUSC
- Serial number 73268434
- Registration number 1177004
- Filing date Jun 30, 1980
- Microtronics Corp.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments