Mitsubishi Denki Kabushki Kaisha

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Agent method and computer system
- Patent number 6,785,819
- Issue date Aug 31, 2004
- Mitsubishi Denki Kabushki Kaisha
- Takashi Sakakura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 6,653,671
- Issue date Nov 25, 2003
- Mitsubishi Denki Kabushki Kaisha
- Kazuyoshi Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Synchronous semiconductor memory device capable of high speed readi...
- Patent number 6,473,360
- Issue date Oct 29, 2002
- Mitsubishi Denki Kabushki Kaisha
- Tsukasa Ooishi
- G11 - INFORMATION STORAGE
Information Patent Grant
DSRC car-mounted equipment
- Patent number 6,356,207
- Issue date Mar 12, 2002
- Mitsubishi Denki Kabushki Kaisha
- Jun Oouchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Speaker apparatus and waterproof cover therefor
- Patent number 6,128,394
- Issue date Oct 3, 2000
- Mitsubishi Jidosha Kogyo Kabushiki Kaisha
- Fujio Hayakawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wire bonding method, wire bonding apparatus and semiconductor devic...
- Patent number 6,105,848
- Issue date Aug 22, 2000
- Mitsubishi Denki Kabushki Kaisha
- Hiroshi Horibe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Mobile station, communication system, communication control method
- Publication number 20070081498
- Publication date Apr 12, 2007
- Mitsubishi Denki Kabushki Kaisha
- Kazuhito Niwano
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor laser element
- Publication number 20070002916
- Publication date Jan 4, 2007
- Mitsubishi Denki Kabushki Kaisha
- Tadashi Takase
- B82 - NANO-TECHNOLOGY
Information Patent Application
Inspection apparatus for foreign matter and pattern defect
- Publication number 20010046044
- Publication date Nov 29, 2001
- Mitsubishi Denki Kabushki Kaisha
- Yoko Miyazaki
- G01 - MEASURING TESTING

Trademarklast 30 trademarks