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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for measuring size of particle or defect
Patent number
5,471,298
Issue date
Nov 28, 1995
Mitsui Minings & Melting Co., Ltd.
Kazuo Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring photoluminescence in crystal
Patent number
5,381,016
Issue date
Jan 10, 1995
Mitsui Minings & Melting Co., Ltd.
Kazuo Moriya
G01 - MEASURING TESTING
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