MJC Probe Inc.

Organization

Chu-PEI City, TW

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Probing device
- Patent number 7,782,070
- Issue date Aug 24, 2010
- MJC Probe Incorporated
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Waterproof and breathable insole
- Patent number 7,543,398
- Issue date Jun 9, 2009
- MJC Probe Incorporation
- Chung-Hu Hsaio
- A43 - FOOTWEAR
Information Patent Grant
Probe card
- Patent number 7,477,061
- Issue date Jan 13, 2009
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Elastic micro probe and method of making same
- Patent number 7,446,548
- Issue date Nov 4, 2008
- MJC Probe Incorporation
- Chih-Chung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe device
- Patent number 7,400,156
- Issue date Jul 15, 2008
- MJC Probe Incorporation
- Shih-Chang Wu
- G01 - MEASURING TESTING
Information Patent Grant
Vertical type high frequency probe card
- Patent number 7,368,928
- Issue date May 6, 2008
- MJC Probe Incorporation
- Hsin-Hung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Micro contact device comprising the micro contact element and the b...
- Patent number 7,267,557
- Issue date Sep 11, 2007
- MJC Probe Incorporation
- Chih-Chung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit probe card
- Patent number 7,154,284
- Issue date Dec 26, 2006
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Grant
Probe device for electrical testing an integrated circuit device an...
- Patent number 7,053,636
- Issue date May 30, 2006
- MJC Probe Incorporation
- Hendra Sudin
- G01 - MEASURING TESTING
Information Patent Grant
Multi-function probe card
- Patent number 6,984,998
- Issue date Jan 10, 2006
- MJC Probe Inc.
- Horng-Chuan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit probe card
- Patent number 6,876,216
- Issue date Apr 5, 2005
- MJC Probe Incorporation
- Lu Fu-Chin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR PROBING DIE ELECTRICITY AND METHOD FOR FORMING THE SAME
- Publication number 20130147507
- Publication date Jun 13, 2013
- MJC PROBE INC.
- CHUNG-TSE LEE
- G01 - MEASURING TESTING
Information Patent Application
PICK-AND-PLACE APPARATUS
- Publication number 20110076124
- Publication date Mar 31, 2011
- MJC PROBE INC.
- Tien-Te Yang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBING DEVICE
- Publication number 20090009198
- Publication date Jan 8, 2009
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONTACT DEVICE AND ITS MANUFACTURING PROCESS
- Publication number 20080278185
- Publication date Nov 13, 2008
- MJC Probe Incorporation
- Chih-Chung CHEN
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-type probe card for high frequency application
- Publication number 20080191726
- Publication date Aug 14, 2008
- MJC PROBE INCORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL TYPE HIGH FREQUENCY PROBE CARD
- Publication number 20080054918
- Publication date Mar 6, 2008
- MJC PROBE INCORPORATION
- Hsin-Hung Lin
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe device
- Publication number 20080054919
- Publication date Mar 6, 2008
- MJC PROBE INCORPORATION
- Shih-Chang Wu
- G01 - MEASURING TESTING
Information Patent Application
High-frequency probe card and transmission line for high-frequency...
- Publication number 20080007278
- Publication date Jan 10, 2008
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
Multi-Directional Gripping Apparatus
- Publication number 20070217897
- Publication date Sep 20, 2007
- MJC Probe Inc.
- Tien-Te Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High frequency cantilever-type probe card
- Publication number 20070200584
- Publication date Aug 30, 2007
- MJC Probe Inc.
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20070176614
- Publication date Aug 2, 2007
- MJC Probe Incorporation
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Application
Method for making guide panel for vertical probe card in batch
- Publication number 20070114204
- Publication date May 24, 2007
- MJC Probe Incorporation
- Chih-Yung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Reinforced guide panel for vertical probe card
- Publication number 20070115012
- Publication date May 24, 2007
- MJC Probe Incorporation
- Chih-Yung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Probes of probe card and the method of making the same
- Publication number 20070103177
- Publication date May 10, 2007
- MJC Probe Incorporation
- Chih-Chung Chen
- G01 - MEASURING TESTING
Information Patent Application
Stepped PCB for probe card, probe card having the same and method f...
- Publication number 20070090847
- Publication date Apr 26, 2007
- MJC Probe Incorporation
- Fu-Chin Lu
- G01 - MEASURING TESTING
Information Patent Application
Electrical contact device of probe card
- Publication number 20070045535
- Publication date Mar 1, 2007
- MJC Probe Incorporation
- Chih-Chung Chen
- G01 - MEASURING TESTING
Information Patent Application
Elastic micro probe and method of making same
- Publication number 20060208751
- Publication date Sep 21, 2006
- MJC PROBE INCORPORATION
- Chih-Chung Chen
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe card, probes for vertical probe card and method of m...
- Publication number 20060170440
- Publication date Aug 3, 2006
- MJC PROBE INCORPORATION
- Hendra Sudin
- G01 - MEASURING TESTING
Information Patent Application
Micro contact device comprising the micro contact element and the b...
- Publication number 20060172568
- Publication date Aug 3, 2006
- MJC Probe Incorporation
- Chih-Chung Chen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROBE CARD
- Publication number 20060022686
- Publication date Feb 2, 2006
- MJC PROBE INCORPORATION
- Horng-Kuang Fan
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND PROBE CARD USING THE SAME
- Publication number 20050200375
- Publication date Sep 15, 2005
- MJC PROBE INCORPORATION
- Hendra Sudin
- G01 - MEASURING TESTING
Information Patent Application
Multi-function probe card
- Publication number 20050184741
- Publication date Aug 25, 2005
- MJC Probe Inc.
- Horng-Chuan Sun
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROBE CARD
- Publication number 20040232925
- Publication date Nov 25, 2004
- MJC PROBE INCORPORATION
- Lu Fu-Chin
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
77420622 - MPI
- Serial number 77420622
- Registration number 3658964
- Filing date Mar 13, 2008
- MJC PROBE INCORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

MJC Probe Inc.

Organization

Patents Grantslast 30 patents

Probing device

Waterproof and breathable insole

Probe card

Elastic micro probe and method of making same

Vertical probe device

Vertical type high frequency probe card

Micro contact device comprising the micro contact element and the b...

Integrated circuit probe card

Probe device for electrical testing an integrated circuit device an...

Multi-function probe card

Integrated circuit probe card

Patents Applicationslast 30 patents

APPARATUS FOR PROBING DIE ELECTRICITY AND METHOD FOR FORMING THE SAME

PICK-AND-PLACE APPARATUS

PROBING DEVICE

ELECTRICAL CONTACT DEVICE AND ITS MANUFACTURING PROCESS

Cantilever-type probe card for high frequency application

VERTICAL TYPE HIGH FREQUENCY PROBE CARD

Vertical probe device

High-frequency probe card and transmission line for high-frequency...

Multi-Directional Gripping Apparatus

High frequency cantilever-type probe card

Probe card

Method for making guide panel for vertical probe card in batch

Reinforced guide panel for vertical probe card

Probes of probe card and the method of making the same

Stepped PCB for probe card, probe card having the same and method f...

Electrical contact device of probe card

Elastic micro probe and method of making same

Vertical probe card, probes for vertical probe card and method of m...

Micro contact device comprising the micro contact element and the b...

INTEGRATED CIRCUIT PROBE CARD

PROBE DEVICE AND PROBE CARD USING THE SAME

Multi-function probe card

INTEGRATED CIRCUIT PROBE CARD

Trademarklast 30 trademarks

77420622 - MPI