MULTIPROBE, INC.

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer isolated transfer chuck
- Patent number 8,800,998
- Issue date Aug 12, 2014
- Multiprobe, Inc.
- Andrew N. Erickson
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Software synchronization of multiple scanning probes
- Patent number 7,444,857
- Issue date Nov 4, 2008
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Grant
Deconvolving tip artifacts using multiple scanning probes
- Patent number 7,415,868
- Issue date Aug 26, 2008
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Grant
Software synchronization of multiple scanning probes
- Patent number 6,951,130
- Issue date Oct 4, 2005
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING
Information Patent Grant
Software synchronization of multiple scanning probes
- Patent number 6,880,389
- Issue date Apr 19, 2005
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
- Publication number 20160216314
- Publication date Jul 28, 2016
- MULTIPROBE, INC.
- Andrew N. Erickson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ATOMIC FORCE, NEAR-FIELD SCANNING OPTICAL...
- Publication number 20150338627
- Publication date Nov 26, 2015
- MULTIPROBE, INC.
- Andrew Norman Erickson
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR WAFER ISOLATED TRANSFER CHUCK
- Publication number 20130168929
- Publication date Jul 4, 2013
- MULTIPROBE, INC.
- Andrew N. Erickson
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
- Publication number 20120146669
- Publication date Jun 14, 2012
- MULTIPROBE, INC.
- Andrew N. Erickson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q...
- Publication number 20100148813
- Publication date Jun 17, 2010
- MULTIPROBE, INC.
- Andrew N. Erickson
- G01 - MEASURING TESTING
Information Patent Application
Deconvolving tip artifacts using multiple scanning probes
- Publication number 20070084273
- Publication date Apr 19, 2007
- Multiprobe, Inc.
- Casey Patrick Hare
- G01 - MEASURING TESTING

Trademarklast 30 trademarks