Nan Ya Technology Corporation

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Taoyuan Hsien, TW

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Patents Grantslast 30 patents

Information Patent Grant
Capacitor array and method of fabricating the same
- Patent number 8,921,977
- Issue date Dec 30, 2014
- Nan Ya Technology Corporation
- Jen Jui Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing sidewall spacers on a memory device
- Patent number 8,890,214
- Issue date Nov 18, 2014
- Nan Ya Technology Corporation
- Panda Durga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment mark and method of manufacturing the same
- Patent number 8,723,341
- Issue date May 13, 2014
- Nan Ya Technology Corporation
- Chen Ku Chiang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Voltage regulator with improved voltage regulator response and redu...
- Patent number 8,710,811
- Issue date Apr 29, 2014
- Nan Ya Technology Corporation
- Yuan Zhong Wan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Circuit structure with conductive and depletion regions to form tun...
- Patent number 8,604,542
- Issue date Dec 10, 2013
- Nan Ya Technology Corporation
- Jeng Hsing Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit structure with vertical double gate
- Patent number 8,476,704
- Issue date Jul 2, 2013
- Nan Ya Technology Corporation
- Jeng Hsing Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer cleaning apparatus with multiple wash-heads
- Patent number 7,252,099
- Issue date Aug 7, 2007
- Nan Ya Technology Corporation
- Chih-Kun Chen
- B08 - CLEANING
Information Patent Grant
Method for pre-retaining CB opening
- Patent number 7,144,799
- Issue date Dec 5, 2006
- Nan Ya Technology Corporation
- Yinan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting wafer flaw
- Patent number 6,941,811
- Issue date Sep 13, 2005
- Nan Ya Technology Corporation
- Chih-Kun Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device used for detecting clamping force of processed object and me...
- Patent number 6,920,796
- Issue date Jul 26, 2005
- Nan Ya Technology Corporation
- Chih-Kun Chen
- G01 - MEASURING TESTING
Information Patent Grant
Incremental offset measurement instrument
- Patent number 6,772,528
- Issue date Aug 10, 2004
- Nan Ya Technology Corporation
- Ming Fa Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating self-aligned contact hole
- Patent number 6,303,491
- Issue date Oct 16, 2001
- Nan Ya Technology Corporation
- Tzu-Ching Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for manufacturing contact windows in semicondu...
- Patent number 6,297,151
- Issue date Oct 2, 2001
- Nan Ya Technology Corporation
- Julian Y. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for manufacturing contact windows in semicondu...
- Patent number 6,153,900
- Issue date Nov 28, 2000
- Nan Ya Technology Corporation
- Julian Y. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a trench capacitor
- Patent number 6,117,726
- Issue date Sep 12, 2000
- Nan Ya Technology Corporation
- Hsin-Chuan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multilevel interconnect structure for integrated circuits
- Patent number 6,011,311
- Issue date Jan 4, 2000
- Nan Ya Technology Corporation
- Edward Hsien-Sheng Hsing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a storage plate of a semiconductor capacitor
- Patent number 5,960,295
- Issue date Sep 28, 1999
- Nan Ya Technology Corporation
- Tean-Sen Jen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a capactior in a DRAM cell
- Patent number 5,858,835
- Issue date Jan 12, 1999
- Nan Ya Technology Corporation
- Chi-Hui Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method and structure for aligner of liquid crystal di...
- Patent number 5,739,883
- Issue date Apr 14, 1998
- Nan Ya Technology Corporation
- Kun-Ti Chen
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR FORMING RUTILE TITANIUM OXIDE AND THE STACKING STRUCTURE...
- Publication number 20130182367
- Publication date Jul 18, 2013
- Nan Ya Technology Corporation
- Chun I HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR STRUCTURE AND METHOD FOR PREPARING THE SAME
- Publication number 20130161734
- Publication date Jun 27, 2013
- Nan Ya Technology Corporation
- Tieh Chiang WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SIDEWALL SPACERS ON A MEMORY DEVICE
- Publication number 20130161700
- Publication date Jun 27, 2013
- Nan Ya Technology Corporation
- Panda Durga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITOR ARRAY AND METHOD OF FABRICATING THE SAME
- Publication number 20130161786
- Publication date Jun 27, 2013
- Nan Ya Technology Corporation
- Jen Jui Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT MARK AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130161841
- Publication date Jun 27, 2013
- Nan Ya Technology Corporation
- Chen Ku CHIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER SUPPORTING STRUCTURE
- Publication number 20130147129
- Publication date Jun 13, 2013
- Nan Ya Technology Corporation
- Chui Fu Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit Structure with Resistors or Capacitors
- Publication number 20130049846
- Publication date Feb 28, 2013
- Nan Ya Technology Corporation
- Jeng Hsing Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit Structure with Vertical Double Gate
- Publication number 20130043529
- Publication date Feb 21, 2013
- Nan Ya Technology Corporation
- Jeng Hsing Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE USED FOR DETECTING CLAMPING FORCE OF PROCESSED OBJECT AND ME...
- Publication number 20050103121
- Publication date May 19, 2005
- NAN YA TECHNOLOGY CORPORATION
- Chih-Kun Chen
- G01 - MEASURING TESTING
Information Patent Application
Incremental offset measurement instrument
- Publication number 20040016140
- Publication date Jan 29, 2004
- Nan Ya Technology Corporation
- Ming Fa Tsai
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
75323386 - NANYA
- Serial number 75323386
- Registration number 2296548
- Filing date Jul 11, 1997
- NAN YA TECHNOLOGY CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75323385
- Serial number 75323385
- Registration number 2245071
- Filing date Jul 11, 1997
- NAN YA TECHNOLOGY CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75087433 - NAN YA
- Serial number 75087433
- Filing date Apr 12, 1996
- NAN YA TECHNOLOGY CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Nan Ya Technology Corporation

Organization

Patents Grantslast 30 patents

Capacitor array and method of fabricating the same

Method of manufacturing sidewall spacers on a memory device

Alignment mark and method of manufacturing the same

Voltage regulator with improved voltage regulator response and redu...

Circuit structure with conductive and depletion regions to form tun...

Circuit structure with vertical double gate

Wafer cleaning apparatus with multiple wash-heads

Method for pre-retaining CB opening

Method and apparatus for detecting wafer flaw

Device used for detecting clamping force of processed object and me...

Incremental offset measurement instrument

Method for fabricating self-aligned contact hole

Method and structure for manufacturing contact windows in semicondu...

Method and structure for manufacturing contact windows in semicondu...

Method of making a trench capacitor

Multilevel interconnect structure for integrated circuits

Method for fabricating a storage plate of a semiconductor capacitor

Method for fabricating a capactior in a DRAM cell

Manufacturing method and structure for aligner of liquid crystal di...

Patents Applicationslast 30 patents

METHOD FOR FORMING RUTILE TITANIUM OXIDE AND THE STACKING STRUCTURE...

TRANSISTOR STRUCTURE AND METHOD FOR PREPARING THE SAME

METHOD OF MANUFACTURING SIDEWALL SPACERS ON A MEMORY DEVICE

CAPACITOR ARRAY AND METHOD OF FABRICATING THE SAME

ALIGNMENT MARK AND METHOD OF MANUFACTURING THE SAME

WAFER SUPPORTING STRUCTURE

Circuit Structure with Resistors or Capacitors

Circuit Structure with Vertical Double Gate

DEVICE USED FOR DETECTING CLAMPING FORCE OF PROCESSED OBJECT AND ME...

Incremental offset measurement instrument

Trademarklast 30 trademarks

75323386 - NANYA

75323385

75087433 - NAN YA