Nanda Technologies GmbH

Organization

Unterschleissheim, DE

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspecting bonded wafers
- Patent number 9,355,919
- Issue date May 31, 2016
- Nanda Technologies GmbH
- Markus Estermann
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer inspection system and method
- Patent number 9,182,357
- Issue date Nov 10, 2015
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting and processing semiconductor wafers
- Patent number 8,778,702
- Issue date Jul 15, 2014
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Methods of inspecting and manufacturing semiconductor wafers
- Patent number 8,501,503
- Issue date Aug 6, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Methods of processing and inspecting semiconductor substrates
- Patent number 8,460,946
- Issue date Jun 11, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,368,881
- Issue date Feb 5, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,345,232
- Issue date Jan 1, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,102,521
- Issue date Jan 24, 2012
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system and method
- Patent number 8,072,591
- Issue date Dec 6, 2011
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTING BONDED WAFERS
- Publication number 20130157391
- Publication date Jun 20, 2013
- Nanda Technologies GmbH
- Markus Estermann
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD
- Publication number 20120133760
- Publication date May 31, 2012
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF PROCESSING AND INSPECTING SEMICONDUCTOR SUBSTRATES
- Publication number 20120094401
- Publication date Apr 19, 2012
- IMEC
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD
- Publication number 20110043798
- Publication date Feb 24, 2011
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INPSECTION SYSTEM AND METHOD
- Publication number 20110043796
- Publication date Feb 24, 2011
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM AND METHOD
- Publication number 20100231902
- Publication date Sep 16, 2010
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
79078411 - NANDA TECH
- Serial number 79078411
- Registration number 3910337
- Filing date Dec 4, 2009
- Nanda Technologies GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79078492 - NANDA
- Serial number 79078492
- Registration number 3913232
- Filing date Dec 4, 2009
- Nanda Technologies GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Nanda Technologies GmbH

Organization

Patents Grantslast 30 patents

Methods and systems for inspecting bonded wafers

Semiconductor wafer inspection system and method

Method of inspecting and processing semiconductor wafers

Methods of inspecting and manufacturing semiconductor wafers

Methods of processing and inspecting semiconductor substrates

Optical inspection system and method

Optical inspection system and method

Optical inspection system and method

Optical inspection system and method

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR INSPECTING BONDED WAFERS

OPTICAL INSPECTION SYSTEM AND METHOD

METHODS OF PROCESSING AND INSPECTING SEMICONDUCTOR SUBSTRATES

OPTICAL INSPECTION SYSTEM AND METHOD

OPTICAL INPSECTION SYSTEM AND METHOD

OPTICAL INSPECTION SYSTEM AND METHOD

Trademarklast 30 trademarks

79078411 - NANDA TECH

79078492 - NANDA