Nanjing LiAn Semiconductor Limited

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Patents Grantslast 30 patents

Information Patent Grant
Wafer shape and flatness measurement apparatus and method
- Patent number 11,105,753
- Issue date Aug 31, 2021
- Nanjing LiAn Semiconductor Limited
- An Andrew Zeng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AIR-BEARING CHUCK
- Publication number 20220118587
- Publication date Apr 21, 2022
- Nanjing LiAn Semiconductor Limited
- An Andrew ZENG
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
MEASURING APPARATUS AND METHOD OF WAFER GEOMETRY
- Publication number 20220120559
- Publication date Apr 21, 2022
- Nanjing LiAn Semiconductor Limited
- An Andrew ZENG
- G01 - MEASURING TESTING
Information Patent Application
TOOL ARCHITECTURE FOR WAFER GEOMETRY MEASUREMENT IN SEMICONDUCTOR I...
- Publication number 20210247178
- Publication date Aug 12, 2021
- Nanjing LiAn Semiconductor Limited
- An Andrew ZENG
- G01 - MEASURING TESTING
Information Patent Application
WAFER SHAPE AND FLATNESS MEASUREMENT APPARATUS AND METHOD
- Publication number 20210199597
- Publication date Jul 1, 2021
- Nanjing LiAn Semiconductor Limited
- An Andrew ZENG
- G01 - MEASURING TESTING

Trademarklast 30 trademarks