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Ilmenau, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Coated active cantilever probes for use in topography imaging in op...
Patent number
11,906,546
Issue date
Feb 20, 2024
Massachusetts Institute of Technology
Fangzhou Xia
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for investigating surface properties of differ...
Patent number
8,689,359
Issue date
Apr 1, 2014
Nano Analytik GmbH
Ivo W. Rangelow
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
Publication number
20220244288
Publication date
Aug 4, 2022
Massachusetts Institute of Technology
Fangzhou XIA
G01 - MEASURING TESTING
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