NANO OR TECHNOLOGIES INC

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Organization

WILMINGTON, DE, US

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Patents Grantslast 30 patents

Information Patent Grant
Spatial and spectral wavefront analysis and measurement
- Patent number 6,819,435
- Issue date Nov 16, 2004
- Nano Or Technologies Inc.
- Yoel Arieli
- G11 - INFORMATION STORAGE

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Patents Applicationslast 30 patents

Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20080088851
- Publication date Apr 17, 2008
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20050094157
- Publication date May 5, 2005
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
Spatial and spectral wavefront analysis and measurement
- Publication number 20020027661
- Publication date Mar 7, 2002
- NANO-OR TECHNOLOGIES INC.
- Yoel Arieli
- G01 - MEASURING TESTING