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Nanonics Imaging, Ltd.
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Jerusalem, IL
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Patents Grants
last 30 patents
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Patent Grant
Multiple plate tip or sample scanning reconfigurable scanned probe...
Patent number
7,047,796
Issue date
May 23, 2006
Nanonics Imaging, Ltd.
Aaron Lewis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SCANNED PROBE MICROSCOPE WITHOUT INTERFERENCE OR GEOMETRIC CONSTRAI...
Publication number
20120137395
Publication date
May 31, 2012
NANONICS IMAGING LTD.
Aaron Lewis
G01 - MEASURING TESTING
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last 30 trademarks