NANOPHOTONICS AG

Organization

Mainz, DE

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Inspection device and inspection method for the optical examination...
- Patent number 8,289,509
- Issue date Oct 16, 2012
- NanoPhotonics AG
- Holger Wenz
- G01 - MEASURING TESTING
Information Patent Grant
Holding device for disk-shaped objects
- Patent number 7,284,760
- Issue date Oct 23, 2007
- Nanophotonics AG
- Sönke Siebert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modular substrate measurement system
- Patent number 7,030,401
- Issue date Apr 18, 2006
- NanoPhotonics AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for measuring surface defects
- Patent number 6,954,267
- Issue date Oct 11, 2005
- NanoPhotonics AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Measurement configuration including a vehicle and method for perfor...
- Patent number 6,935,201
- Issue date Aug 30, 2005
- Infineon Technologies AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement box with module for measuring wafer characteristics
- Patent number 6,891,609
- Issue date May 10, 2005
- NanoPhotonics AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring module
- Patent number 6,798,513
- Issue date Sep 28, 2004
- NanoPhotonics AB
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum measurement device
- Patent number 6,734,969
- Issue date May 11, 2004
- NanoPhotonics AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Modular substrate measurement system
- Patent number 6,420,864
- Issue date Jul 16, 2002
- NanoPhotonics AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micropolarimeter and ellipsometer
- Patent number 6,275,291
- Issue date Aug 14, 2001
- NanoPhotonics AG
- Michael Abraham
- G02 - OPTICS
Information Patent Grant
Method and device for automatic relative adjustment of samples in r...
- Patent number 6,091,499
- Issue date Jul 18, 2000
- NanoPhotonics AG
- Michael Abraham
- G01 - MEASURING TESTING

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
Inspection device and inspection method for the optical examination...
- Publication number 20100195097
- Publication date Aug 5, 2010
- NANOPHOTONICS AG
- Holger Wenz
- G01 - MEASURING TESTING
Information Patent Application
Holding and turning device for touch-sensitive flat objects
- Publication number 20100001449
- Publication date Jan 7, 2010
- NANOPHOTONICS AG
- Sönke Siebert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement box
- Publication number 20030193671
- Publication date Oct 16, 2003
- NANOPHOTONICS AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring module
- Publication number 20030193660
- Publication date Oct 16, 2003
- NANOPHOTONICS AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Application
Device for measuring surface defects
- Publication number 20030193666
- Publication date Oct 16, 2003
- NANOPHOTONICS AG
- Michael Abraham
- G01 - MEASURING TESTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
79031217 - JANUS
- Serial number 79031217
- Filing date Aug 5, 2006
- NanoPhotonics AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79031218 - BEVEL CAM
- Serial number 79031218
- Filing date Aug 5, 2006
- NanoPhotonics AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78102117 - ELLIPSON
- Serial number 78102117
- Registration number 2697879
- Filing date Jan 11, 2002
- NanoPhotonics AG
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

NANOPHOTONICS AG

Organization

Patents Grantslast 30 patents

Inspection device and inspection method for the optical examination...

Holding device for disk-shaped objects

Modular substrate measurement system

Device for measuring surface defects

Measurement configuration including a vehicle and method for perfor...

Measurement box with module for measuring wafer characteristics

Measuring module

Vacuum measurement device

Modular substrate measurement system

Micropolarimeter and ellipsometer

Method and device for automatic relative adjustment of samples in r...

Patents Applicationslast 30 patents

Inspection device and inspection method for the optical examination...

Holding and turning device for touch-sensitive flat objects

Measurement box

Measuring module

Device for measuring surface defects

Trademarklast 30 trademarks

79031217 - JANUS

79031218 - BEVEL CAM

78102117 - ELLIPSON