NANOTOOLS GMBH

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Muenchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Characterization structure for an atomic force microscope tip
- Patent number 8,739,310
- Issue date May 27, 2014
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Johann Foucher
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam source and method of manufacturing the same
- Patent number 8,164,071
- Issue date Apr 24, 2012
- Carl Zeiss NTS GmbH
- Volker Drexel
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210318351
- Publication date Oct 14, 2021
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20200341028
- Publication date Oct 29, 2020
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120131785
- Publication date May 31, 2012
- NANOTOOLS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SOURCE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100078557
- Publication date Apr 1, 2010
- CARL ZEISS NTS GMBH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
79026060 - N NANOTOOLS
- Serial number 79026060
- Registration number 3476734
- Filing date Jun 17, 2005
- Nanotools GmbH
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments