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Patents Grants
last 30 patents
Information
Patent Grant
Scintillator screen manufacturing method, scintillator screen and c...
Patent number
11,796,691
Issue date
Oct 24, 2023
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Kai Yang
G01 - MEASURING TESTING
Information
Patent Grant
Multi-energy static security CT system and imaging method
Patent number
11,789,175
Issue date
Oct 17, 2023
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Baolei Li
G01 - MEASURING TESTING
Information
Patent Grant
Scanning-type x-ray source and imaging system therefor
Patent number
11,569,055
Issue date
Jan 31, 2023
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Zhili Cui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-speed real-time bus system and data processing method thereof
Patent number
11,469,918
Issue date
Oct 11, 2022
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Zhili Cui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Arc-shaped multi-focal point fixed anode gate controlled ray source
Patent number
11,456,144
Issue date
Sep 27, 2022
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Jinhui Xing
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stationary real time CT imaging system and method thereof
Patent number
10,743,826
Issue date
Aug 18, 2020
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Hongguang Cao
G01 - MEASURING TESTING
Information
Patent Grant
Photon count-based radiation imaging system, method and device thereof
Patent number
10,359,375
Issue date
Jul 23, 2019
NANOVISION TECHNOLOGY (BEIJING) CO., LTD.
Hongguang Cao
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
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Patent Application
CONNECTION DEVICE AND CORRESPONDING X-RAY SOURCE
Publication number
20230307203
Publication date
Sep 28, 2023
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Zhili Cui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTO EXPOSURE CONTROL SYSTEM AND IMAGE CORRECTION METHOD
Publication number
20230068259
Publication date
Mar 2, 2023
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Zhili CUI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTI-ENERGY STATIC SECURITY CT SYSTEM AND IMAGING METHOD
Publication number
20210325563
Publication date
Oct 21, 2021
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Baolei LI
G01 - MEASURING TESTING
Information
Patent Application
SCINTILLATOR SCREEN MANUFACTURING METHOD, SCINTILLATOR SCREEN AND C...
Publication number
20210311210
Publication date
Oct 7, 2021
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Kai YANG
G01 - MEASURING TESTING
Information
Patent Application
SCANNING-TYPE X-RAY SOURCE AND IMAGING SYSTEM THEREFOR
Publication number
20210148840
Publication date
May 20, 2021
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Zhili CUI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-SPEED REAL-TIME BUS SYSTEM AND DATA PROCESSING METHOD THEREOF
Publication number
20200358633
Publication date
Nov 12, 2020
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Zhili CUI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARC-SHAPED MULTI-FOCAL POINT FIXED ANODE GATE CONTROLLED RAY SOURCE
Publication number
20200321183
Publication date
Oct 8, 2020
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Jinhui XING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STATIONARY REAL TIME CT IMAGING SYSTEM AND METHOD THEREOF
Publication number
20170164910
Publication date
Jun 15, 2017
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Hongguang CAO
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
PHOTON COUNT-BASED RADIATION IMAGING SYSTEM, METHOD AND DEVICE THEREOF
Publication number
20160266054
Publication date
Sep 15, 2016
NANOVISION TECHNOLOGY (BEIJING) CO., LTD
Hongguang CAO
G01 - MEASURING TESTING
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