Nat. Inst. Of Avdanced Industr. Science And Tech.

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Tokyo, JP

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Patents Applicationslast 30 patents

Information Patent Application
Method and device for detecting low rigidity
- Publication number 20050166687
- Publication date Aug 4, 2005
- Nat. Inst. Of Avdanced Industr. Science And Tech.
- Kenji Kaneko
- G01 - MEASURING TESTING