National Institute of Metrology

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Automatic large-mass-weight handling system
- Patent number 11,835,378
- Issue date Dec 5, 2023
- National Institute of Metrology
- Xiaoping Ren
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating phase-frequency characteristic of low freque...
- Patent number 11,067,596
- Issue date Jul 20, 2021
- National Institute of Metrology
- Chenguang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Laser heterodyne interferometric apparatus and method based on plan...
- Patent number 10,907,950
- Issue date Feb 2, 2021
- National Institute of Metrology
- Yang Bai
- G01 - MEASURING TESTING
Information Patent Grant
High accuracy measuring device for measuring large mass
- Patent number 10,378,950
- Issue date Aug 13, 2019
- National Institute of Metrology
- Jian Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for measuring large mass with optical refraction a...
- Patent number 10,274,362
- Issue date Apr 30, 2019
- National Institute of Metrology
- Jian Wang
- G01 - MEASURING TESTING
Information Patent Grant
Absolute measurement method and apparatus thereof for non-linear error
- Patent number 9,347,823
- Issue date May 24, 2016
- National Institute of Metrology
- Ruoduan Sun
- G01 - MEASURING TESTING
Information Patent Grant
Method of extreme ultraviolet lithography projection objective
- Patent number 9,323,158
- Issue date Apr 26, 2016
- National Institute of Metrology
- Yanqiu Li
- G02 - OPTICS
Information Patent Grant
Cylindrical model eye, cylindrical test device and the manufacturin...
- Patent number 7,742,244
- Issue date Jun 22, 2010
- National Institute of Metrology
- Wenli Liu
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SCALING MODULE, AND CALIBRATION METHOD AND USE METHOD THEREFOR
- Publication number 20240319335
- Publication date Sep 26, 2024
- National Institute of Metrology
- Haiyong GAN
- G01 - MEASURING TESTING
Information Patent Application
Automatic Large-Mass-Weight Handling System
- Publication number 20230194332
- Publication date Jun 22, 2023
- National Institute of Metrology
- Xiaoping Ren
- G01 - MEASURING TESTING
Information Patent Application
Laser Heterodyne Interferometric Apparatus and Method Based on Plan...
- Publication number 20210010794
- Publication date Jan 14, 2021
- National Institute of Metrology
- Yang BAI
- G01 - MEASURING TESTING
Information Patent Application
A High Accuracy Measuring Device for Measuring Large Mass
- Publication number 20190086255
- Publication date Mar 21, 2019
- National Institute of Metrology
- Jian WANG
- G01 - MEASURING TESTING
Information Patent Application
A Measuring Device for Measuring Large Mass with Optical Refraction...
- Publication number 20180335337
- Publication date Nov 22, 2018
- National Institute of Metrology
- Jian WANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR VISUAL THRESHOLD MEASUREMENT
- Publication number 20150150451
- Publication date Jun 4, 2015
- National Institute of Metrology
- Jiyan Zhang
- G02 - OPTICS
Information Patent Application
Cylindrical Model Eye, Cylindrical Test Device And The Manufacturin...
- Publication number 20090109434
- Publication date Apr 30, 2009
- National Institute of Metrology
- Wenli Liu
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

National Institute of Metrology

Organization

Patents Grantslast 30 patents

Automatic large-mass-weight handling system

Method for calibrating phase-frequency characteristic of low freque...

Laser heterodyne interferometric apparatus and method based on plan...

High accuracy measuring device for measuring large mass

Measuring device for measuring large mass with optical refraction a...

Absolute measurement method and apparatus thereof for non-linear error

Method of extreme ultraviolet lithography projection objective

Cylindrical model eye, cylindrical test device and the manufacturin...

Patents Applicationslast 30 patents

SCALING MODULE, AND CALIBRATION METHOD AND USE METHOD THEREFOR

Automatic Large-Mass-Weight Handling System

Laser Heterodyne Interferometric Apparatus and Method Based on Plan...

A High Accuracy Measuring Device for Measuring Large Mass

A Measuring Device for Measuring Large Mass with Optical Refraction...

DEVICE AND METHOD FOR VISUAL THRESHOLD MEASUREMENT

Cylindrical Model Eye, Cylindrical Test Device And The Manufacturin...

Trademarklast 30 trademarks