Negevtech Ltd.

Organization

Rehovot, IL

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
System for detection of water defects
- Patent number 7,525,659
- Issue date Apr 28, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 7,486,861
- Issue date Feb 3, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,480,039
- Issue date Jan 20, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,477,383
- Issue date Jan 13, 2009
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection through image comparison using relative measures
- Patent number 7,369,236
- Issue date May 6, 2008
- Negevtech, Ltd.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi mode inspection method and apparatus
- Patent number 7,274,444
- Issue date Sep 25, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 7,260,298
- Issue date Aug 21, 2007
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
System for detection of wafer defects
- Patent number 7,180,586
- Issue date Feb 20, 2007
- Negevtech Ltd.
- Gad Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optical illumination system
- Patent number 6,892,013
- Issue date May 10, 2005
- Negevtech Ltd.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for fast on-line electro-optical detection of waf...
- Patent number 6,693,664
- Issue date Feb 17, 2004
- Negevtech
- Gad Neumann
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION
- Publication number 20090225307
- Publication date Sep 10, 2009
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION TOOL FEATURING MULTIPLE SPEED MODES
- Publication number 20090030630
- Publication date Jan 29, 2009
- NEGEVTECH, LTD.
- Giora Eitan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Image Splitting in Optical Inspection Systems
- Publication number 20080137073
- Publication date Jun 12, 2008
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Image Splitting in Optical Inspection Systems
- Publication number 20080137074
- Publication date Jun 12, 2008
- NEGEVTECH, LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION THROUGH IMAGE COMPARISON USING RELATIVE MEASURES
- Publication number 20080100844
- Publication date May 1, 2008
- Negevtech, Ltd.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Detection Through Image Comparison Using Relative Measures
- Publication number 20080101686
- Publication date May 1, 2008
- NEGEVTECH, LTD.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Speckle reduction using a fiber bundle and light guide
- Publication number 20080037933
- Publication date Feb 14, 2008
- Negevtech, Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Application
Fiber optical illumination system
- Publication number 20070146694
- Publication date Jun 28, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070019856
- Publication date Jan 25, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20070013903
- Publication date Jan 18, 2007
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244956
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244958
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20060244957
- Publication date Nov 2, 2006
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting defects in wafers
- Publication number 20060193507
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Erez Sali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for detecting defects in wafers including alig...
- Publication number 20060193506
- Publication date Aug 31, 2006
- Negevtech Ltd.
- Yuval Dorphan
- G01 - MEASURING TESTING
Information Patent Application
Programmable spatial filter for wafer inspection
- Publication number 20060012781
- Publication date Jan 19, 2006
- NEGEVTECH LTD.
- Keren Fradkin
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20050180707
- Publication date Aug 18, 2005
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS
Information Patent Application
System for detection of wafer defects
- Publication number 20050110987
- Publication date May 26, 2005
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
System for detection of wafer defects
- Publication number 20040146295
- Publication date Jul 29, 2004
- NEGEVTECH LTD.
- Dov Furman
- G01 - MEASURING TESTING
Information Patent Application
Fiber optical illumination system
- Publication number 20040136665
- Publication date Jul 15, 2004
- NEGEVTECH LTD.
- Dov Furman
- G02 - OPTICS

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Trademarklast 30 trademarks

Information Trademark
77381772 - STEP&IMAGE
- Serial number 77381772
- Filing date Jan 28, 2008
- Negevtech, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77332770 - NEGEVTECH
- Serial number 77332770
- Registration number 3466939
- Filing date Nov 19, 2007
- Negevtech, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Negevtech Ltd.

Organization

Patents Grantslast 30 patents

System for detection of water defects

Fiber optical illumination system

Multi mode inspection method and apparatus

System for detection of wafer defects

Defect detection through image comparison using relative measures

Multi mode inspection method and apparatus

Fiber optical illumination system

System for detection of wafer defects

Fiber optical illumination system

Method and system for fast on-line electro-optical detection of waf...

Patents Applicationslast 30 patents

WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION

OPTICAL INSPECTION TOOL FEATURING MULTIPLE SPEED MODES

Image Splitting in Optical Inspection Systems

Image Splitting in Optical Inspection Systems

DEFECT DETECTION THROUGH IMAGE COMPARISON USING RELATIVE MEASURES

Defect Detection Through Image Comparison Using Relative Measures

Speckle reduction using a fiber bundle and light guide

Fiber optical illumination system

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

System for detection of wafer defects

Method and apparatus for detecting defects in wafers

Method and apparatus for detecting defects in wafers including alig...

Programmable spatial filter for wafer inspection

Fiber optical illumination system

System for detection of wafer defects

System for detection of wafer defects

Fiber optical illumination system

Trademarklast 30 trademarks

77381772 - STEP&IMAGE

77332770 - NEGEVTECH