NEXTEST SYSTEMS CORPORATION

Organization

NORTH READING, MA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for using probe card
- Patent number 8,120,375
- Issue date Feb 21, 2012
- Nextest Systems Corporation
- Craig Z. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing and programming memory devices and system for same
- Patent number 7,861,059
- Issue date Dec 28, 2010
- Nextest Systems Corporation
- Paul Magliocco
- G11 - INFORMATION STORAGE
Information Patent Grant
System for testing smart cards and method for same
- Patent number 7,765,080
- Issue date Jul 27, 2010
- Nextest Systems Corporation
- Clifford V. Ludwig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor test system having multitasking algorithmic pattern g...
- Patent number 7,472,326
- Issue date Dec 30, 2008
- Nextest Systems Corporation
- John M. Holmes
- G11 - INFORMATION STORAGE
Information Patent Grant
System for testing DUT and tester for use therewith
- Patent number 7,385,385
- Issue date Jun 10, 2008
- Nextest Systems Corporation
- Paul Magliocco
- G01 - MEASURING TESTING
Information Patent Grant
Portable manipulator for stackable semiconductor test system
- Patent number 7,312,604
- Issue date Dec 25, 2007
- Nextest Systems Corporation
- Paul Trudeau
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for planarizing a probe card and method using same
- Patent number 7,098,650
- Issue date Aug 29, 2006
- Nextest Systems Corporation
- Craig Z. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus having pattern scrambler for testing a semiconductor devi...
- Patent number 7,003,697
- Issue date Feb 21, 2006
- Nextest Systems, Corporation
- Paul Magliocco
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test system having double data rate pin scrambling
- Patent number 6,754,868
- Issue date Jun 22, 2004
- Nextest Systems Corporation
- Steven R. Bristow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM
- Publication number 20080100322
- Publication date May 1, 2008
- Nextest Systems Corporation
- Paul Trudeau
- G01 - MEASURING TESTING
Information Patent Application
Portable manipulator for stackable semiconductor test system
- Publication number 20070024296
- Publication date Feb 1, 2007
- Nextest Systems Corporation
- Paul Trudeau
- G01 - MEASURING TESTING
Information Patent Application
Probe card and method for using probe card, wafer prober utilizing...
- Publication number 20060279302
- Publication date Dec 14, 2006
- Nextest Systems Corporation
- Craig Z. Foster
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
78401682 - NEXTEST
- Serial number 78401682
- Registration number 3026946
- Filing date Apr 14, 2004
- Nextest Systems Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78401697 - MAVERICK
- Serial number 78401697
- Registration number 3087184
- Filing date Apr 14, 2004
- Nextest Systems Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78401691 - NEXTEST
- Serial number 78401691
- Registration number 3040252
- Filing date Apr 14, 2004
- Nextest Systems Corporation
- 41 - Education

NEXTEST SYSTEMS CORPORATION

Organization

Patents Grantslast 30 patents

Method for using probe card

Method for testing and programming memory devices and system for same

System for testing smart cards and method for same

Semiconductor test system having multitasking algorithmic pattern g...

System for testing DUT and tester for use therewith

Portable manipulator for stackable semiconductor test system

Apparatus for planarizing a probe card and method using same

Apparatus having pattern scrambler for testing a semiconductor devi...

Semiconductor test system having double data rate pin scrambling

Patents Applicationslast 30 patents

PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM

Portable manipulator for stackable semiconductor test system

Probe card and method for using probe card, wafer prober utilizing...

Trademarklast 30 trademarks

78401682 - NEXTEST

78401697 - MAVERICK

78401691 - NEXTEST