NEXTIN INC

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GYEONGGI-DO, KR

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Patents Grantslast 30 patents

Information Patent Grant
Wafer image inspection apparatus
- Patent number 9,829,441
- Issue date Nov 28, 2017
- NEXTIN, INC.
- Tae Hoon Park
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
DARK-FIELD INSPECTION DEVICE WITH REAL TIME VARIABLE FUNCTION
- Publication number 20240192133
- Publication date Jun 13, 2024
- NEXTIN, INC.
- Tae Hoon Park
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20240071785
- Publication date Feb 29, 2024
- NEXTIN, INC.
- Seoung-Ju Na
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CELL-TO-CELL COMPARISON METHOD
- Publication number 20240029235
- Publication date Jan 25, 2024
- NEXTIN, INC.
- Tae Hoon PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER IMAGE INSPECTION APPARATUS
- Publication number 20170003230
- Publication date Jan 5, 2017
- NEXTIN, INC.
- Tae Hoon PARK
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
97802038 - RESQ
- Serial number 97802038
- Filing date Feb 20, 2023
- NEXTIN, Inc.
- 7 - Machines and machine tools
Information Trademark
75869823 - ADAM MEET EVE
- Serial number 75869823
- Filing date Dec 7, 1999
- NEXTIN, INC.
- 42 - Scientific and technological services and research and design relating thereto