NGR Corporation

Organization

Boyds, MD, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Imaging system and imaging method
- Patent number 10,515,779
- Issue date Dec 24, 2019
- NGR Inc.
- Kotaro Maruyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary particle detection system of scanning electron microscope
- Patent number 10,515,778
- Issue date Dec 24, 2019
- NGR Inc.
- Sumio Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of verifying operation parameter of scanning electron micros...
- Patent number 10,446,365
- Issue date Oct 15, 2019
- NGR Inc.
- Koji Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of utilizing information on shape of frequency distribution...
- Patent number 10,354,375
- Issue date Jul 16, 2019
- NGR Inc.
- Yoshishige Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image generation apparatus
- Patent number 9,793,091
- Issue date Oct 17, 2017
- NGR Inc.
- Hideaki Teshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 9,189,843
- Issue date Nov 17, 2015
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect and critical dimension analysis systems and methods for a se...
- Patent number 8,422,761
- Issue date Apr 16, 2013
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,285,031
- Issue date Oct 9, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for a semiconductor lithographic process control...
- Patent number 8,150,140
- Issue date Apr 3, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,045,785
- Issue date Oct 25, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,983,471
- Issue date Jul 19, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cage making apparatus
- Patent number 6,925,705
- Issue date Aug 9, 2005
- NGR Limited
- Kamal Neckoula
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...

Patents Applicationslast 30 patents

Information Patent Application
IMAGE GENERATION METHOD
- Publication number 20190066971
- Publication date Feb 28, 2019
- NGR Inc.
- Shinichi NAKAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DEFECT DETECTION METHOD
- Publication number 20190025371
- Publication date Jan 24, 2019
- NGR Inc.
- Ryo SHIMODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF VISUALIZING DEFECT USING DESIGN DATA AND DEFECT DETECTION...
- Publication number 20190026881
- Publication date Jan 24, 2019
- NGR Inc.
- Yoshishige SATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING SYSTEM AND IMAGING METHOD
- Publication number 20190019651
- Publication date Jan 17, 2019
- NGR Inc.
- Kotaro MARUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF VERIFYING OPERATION PARAMETER OF SCANNING ELECTRON MICROS...
- Publication number 20190006145
- Publication date Jan 3, 2019
- NGR Inc.
- Koji KANEKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN EDGE DETECTION METHOD
- Publication number 20190005650
- Publication date Jan 3, 2019
- NGR Inc.
- Masahiro OYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETECTING DEFECT OF CONTACT HOLE
- Publication number 20180330494
- Publication date Nov 15, 2018
- NGR Inc.
- Kazuto TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And Apparatus For Integrated Circuit Pattern Inspection With...
- Publication number 20180300872
- Publication date Oct 18, 2018
- NGR Inc.
- Kazuto TANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Utilizing Information On Shape Of Frequency Distribution...
- Publication number 20180005366
- Publication date Jan 4, 2018
- NGR Inc.
- Yoshishige SATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20180005797
- Publication date Jan 4, 2018
- NGR Inc.
- Makoto KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20170372464
- Publication date Dec 28, 2017
- NGR Inc.
- Tadashi KITAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECONDARY PARTICLE DETECTION SYSTEM OF SCANNING ELECTRON MICROSCOPE
- Publication number 20170271124
- Publication date Sep 21, 2017
- NGR Inc.
- Sumio SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20120328181
- Publication date Dec 27, 2012
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems And Methods For Inspecting And Controlling Integrated Circu...
- Publication number 20120117520
- Publication date May 10, 2012
- NGR, Inc.
- Tadashi Kitamura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20110235895
- Publication date Sep 29, 2011
- NGR INC.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cage making apparatus
- Publication number 20040020033
- Publication date Feb 5, 2004
- NGR Limited
- Kamal Neckoula
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...

Trademarklast 30 trademarks

Information Trademark
98791531 - PURABASIS
- Serial number 98791531
- Filing date Oct 9, 2024
- NGR Corporation
- 35 - Advertising

NGR Corporation

Organization

Patents Grantslast 30 patents

Imaging system and imaging method

Secondary particle detection system of scanning electron microscope

Method of verifying operation parameter of scanning electron micros...

Method of utilizing information on shape of frequency distribution...

Image generation apparatus

Pattern inspection apparatus and method

Defect and critical dimension analysis systems and methods for a se...

Pattern inspection apparatus and method

System and method for a semiconductor lithographic process control...

Pattern inspection apparatus and method

Pattern inspection apparatus and method

Cage making apparatus

Patents Applicationslast 30 patents

IMAGE GENERATION METHOD

PATTERN DEFECT DETECTION METHOD

METHOD OF VISUALIZING DEFECT USING DESIGN DATA AND DEFECT DETECTION...

IMAGING SYSTEM AND IMAGING METHOD

METHOD OF VERIFYING OPERATION PARAMETER OF SCANNING ELECTRON MICROS...

PATTERN EDGE DETECTION METHOD

METHOD OF DETECTING DEFECT OF CONTACT HOLE

Method And Apparatus For Integrated Circuit Pattern Inspection With...

Method Of Utilizing Information On Shape Of Frequency Distribution...

SCANNING ELECTRON MICROSCOPE

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

SECONDARY PARTICLE DETECTION SYSTEM OF SCANNING ELECTRON MICROSCOPE

PATTERN INSPECTION APPARATUS AND METHOD

Systems And Methods For Inspecting And Controlling Integrated Circu...

PATTERN INSPECTION APPARATUS AND METHOD

Cage making apparatus

Trademarklast 30 trademarks

98791531 - PURABASIS