Nihon Denshi Kabushiki Kaisha

Organization

Tokyo, JA

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam exposure system
- Patent number RE31630
- Issue date Jul 17, 1984
- Rikagaku Kenkyusho
- Eiichi Goto
- 250 - Radiant energy
Information Patent Grant
Specimen observation apparatus including an optical microscope and...
- Patent number 4,349,242
- Issue date Sep 14, 1982
- Nihon Denshi Kabushiki Kaisha
- Kazumichi Ogura
- G02 - OPTICS
Information Patent Grant
Electron beam aperture device
- Patent number 4,283,632
- Issue date Aug 11, 1981
- Nihon Denshi Kabushiki Kaisha
- Seiichi Nakagawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Magnetic electron lens
- Patent number 4,219,732
- Issue date Aug 26, 1980
- Nihon Denshi Kabushiki Kaisha
- Seiichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for correcting astigmatism in a scanning elect...
- Patent number 4,214,163
- Issue date Jul 22, 1980
- Nihon Denshi Kabushiki Kaisha
- Takao Namae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for automatically focusing an electron beam in...
- Patent number 4,199,681
- Issue date Apr 22, 1980
- Nihon Denshi Kabushiki Kaisha
- Takao Namae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold trap for electron microscope
- Patent number 4,179,605
- Issue date Dec 18, 1979
- Nihon Denshi Kabushiki Kaisha
- Hisao Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic chemical analyzer
- Patent number 4,155,978
- Issue date May 22, 1979
- Nihon Denshi Kabushiki Kaisha
- Toyohiko Naono
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam exposure method
- Patent number 4,151,422
- Issue date Apr 24, 1979
- Rikagaku Kenkyusho
- Eiichi Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for obtaining an X-ray image
- Patent number 4,135,095
- Issue date Jan 16, 1979
- Nihon Denshi Kabushiki Kaisha
- Eiji Watanabe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sampling device
- Patent number 4,120,661
- Issue date Oct 17, 1978
- Nihon Denshi Kabishiki Kaisha
- Toyohiko Naono
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam exposure system
- Patent number 4,119,854
- Issue date Oct 10, 1978
- Nihon Denshi Kabushiki Kaisha
- Kazumitsu Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam exposure system
- Patent number 4,117,340
- Issue date Sep 26, 1978
- Kenkyusho; Rikagaku
- Eiichi Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic analyzing apparatus
- Patent number 4,090,848
- Issue date May 23, 1978
- Nihon Denshi Kabushiki Kaisha
- Toyohiko Naono
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron device
- Patent number 4,071,759
- Issue date Jan 31, 1978
- Nihon Denshi Kabushiki Kaisha
- Takao Namae
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning electron microscope
- Patent number 4,068,123
- Issue date Jan 10, 1978
- Nihon Denshi Kabushiki Kaisha
- Yasushi Kokubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Insulated elastic support and clamping means for resistance heaters...
- Patent number 4,068,145
- Issue date Jan 10, 1978
- Nihon Denshi Kabushiki Kaisha
- Seiichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with superimposed electric and magnetic fields
- Patent number 4,054,796
- Issue date Oct 18, 1977
- Nihon Denshi Kabushiki Kaisha
- Motohiro Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nuclear magnetic resonance apparatus
- Patent number 4,051,429
- Issue date Sep 27, 1977
- Nihon Denshi Kabushiki Kaisha
- Mamoru Imanari
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for tomography comprising a pin hole for forming a microb...
- Patent number 4,045,672
- Issue date Aug 30, 1977
- Nihon Denshi Kabushiki Kaisha
- Eiji Watanabe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for analyzing fine grained substances
- Patent number 4,037,101
- Issue date Jul 19, 1977
- Agency of Industrial Science and Technology
- Kimio Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron device
- Patent number 4,020,343
- Issue date Apr 26, 1977
- Nihon Denshi Kabushiki Kaisha
- Takashi Shimaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron device
- Patent number 4,011,450
- Issue date Mar 8, 1977
- Nihon Denshi Kabushiki Kaisha
- Takashi Tagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single lens, multi-beam system and method for high resolution recor...
- Patent number 4,001,493
- Issue date Jan 4, 1977
- Nihon Denshi Kabushiki Kaisha
- Donald R. Cone
- G11 - INFORMATION STORAGE
Information Patent Grant
Mass spectrometer with superimposed electric and magnetic fields
- Patent number 3,984,682
- Issue date Oct 5, 1976
- Nihon Denshi Kabushiki Kaisha
- Hisashi Matsuda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Contacting pickup optical reproduction system
- Patent number 3,980,811
- Issue date Sep 14, 1976
- Nihon Denshi Kabushiki Kaisha
- Louis F. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Rotary measuring valve
- Patent number 3,978,888
- Issue date Sep 7, 1976
- Nihon Denshi Kabushiki Kaisha
- Toyohiko Naono
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system in a scanning electron microscope
- Patent number 3,978,338
- Issue date Aug 31, 1976
- Nihon Denshi Kabushiki Kaisha
- Katsuyoshi Ueno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron lens
- Patent number 3,952,198
- Issue date Apr 20, 1976
- Nihon Denshi Kabushiki Kaisha
- Yoshiyasu Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for processing a video signal from a scanning...
- Patent number 3,944,829
- Issue date Mar 16, 1976
- Nihon Denshi Kabushiki Kaisha
- Masayuki Sato
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

Information Trademark
73194929 - JEOL
- Serial number 73194929
- Registration number 1148218
- Filing date Nov 29, 1978
- Nihon Denshi Kabushiki Kaisha
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Nihon Denshi Kabushiki Kaisha

Organization

Patents Grantslast 30 patents

Electron beam exposure system

Specimen observation apparatus including an optical microscope and...

Electron beam aperture device

Magnetic electron lens

Method and apparatus for correcting astigmatism in a scanning elect...

Method and apparatus for automatically focusing an electron beam in...

Cold trap for electron microscope

Automatic chemical analyzer

Electron beam exposure method

Apparatus for obtaining an X-ray image

Sampling device

Electron beam exposure system

Electron beam exposure system

Automatic analyzing apparatus

Scanning electron device

Scanning electron microscope

Insulated elastic support and clamping means for resistance heaters...

Mass spectrometer with superimposed electric and magnetic fields

Nuclear magnetic resonance apparatus

Apparatus for tomography comprising a pin hole for forming a microb...

Method and apparatus for analyzing fine grained substances

Scanning electron device

Scanning electron device

Single lens, multi-beam system and method for high resolution recor...

Mass spectrometer with superimposed electric and magnetic fields

Contacting pickup optical reproduction system

Rotary measuring valve

Illumination system in a scanning electron microscope

Electron lens

Method and apparatus for processing a video signal from a scanning...

Patents Applicationslast 30 patents

Trademarklast 30 trademarks

73194929 - JEOL