Nihon Denshizairyo Kabushiki Kaisha

Organization

Amagasaki-shi, JP

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Probe card
- Patent number 7,307,435
- Issue date Dec 11, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,268,568
- Issue date Sep 11, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,208,964
- Issue date Apr 24, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Atsushi Mine
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having a coil spring interposed between a support member...
- Patent number 7,075,319
- Issue date Jul 11, 2006
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 6,980,013
- Issue date Dec 27, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card
- Patent number 6,853,208
- Issue date Feb 8, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for connecting between substrates
- Patent number 6,836,024
- Issue date Dec 28, 2004
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe, manufacture of same, and vertically operative type probe car...
- Patent number 6,300,783
- Issue date Oct 9, 2001
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a semiconductor integrated circuit
- Patent number 6,294,922
- Issue date Sep 25, 2001
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Ring for probe card
- Patent number D424539
- Issue date May 9, 2000
- Nihon Denshizairyo Kabushiki Kaisha
- Hiroyuki Shiroki
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Ring for probe card
- Patent number D424043
- Issue date May 2, 2000
- Nihon Denshizairyo Kabushiki Kaisha
- Hiroyuki Shiroki
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Ring for probe card
- Patent number D420659
- Issue date Feb 15, 2000
- Nihon Denshizairyo Kabushiki Kaisha
- Hiroyuki Shiroki
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Probe card for maintaining the position of a probe in high temperat...
- Patent number 5,670,889
- Issue date Sep 23, 1997
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card in which contact pressure and relative position of each...
- Patent number 5,134,365
- Issue date Jul 28, 1992
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumasa Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card in which contact pressure and relative position of each...
- Patent number 5,055,778
- Issue date Oct 8, 1991
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumasa Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Ion emmissive head and ion beam irradiation device incorporating th...
- Patent number 4,774,413
- Issue date Sep 27, 1988
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fused metal ion source with sintered metal head
- Patent number 4,638,217
- Issue date Jan 20, 1987
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- H01 - BASIC ELECTRIC ELEMENTS

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
Probe card
- Publication number 20070052432
- Publication date Mar 8, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20060061375
- Publication date Mar 23, 2006
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20050184743
- Publication date Aug 25, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Teppei Kimura
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20050184745
- Publication date Aug 25, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20050151547
- Publication date Jul 14, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
PROBE SHEET AND PROBE SHEET UNIT USING SAME
- Publication number 20050099195
- Publication date May 12, 2005
- NIHON DENSHIZAIRYO KABUSHIKI KAISHA
- Kazumichi MACHIDA
- G01 - MEASURING TESTING
Information Patent Application
ARCH TYPE PROBE AND PROBE CARD USING SAME
- Publication number 20050099194
- Publication date May 12, 2005
- NIHON DENSHIZAIRYO KABUSHIKI KAISHA
- Atsushi MINE
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20040104738
- Publication date Jun 3, 2004
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Vertical probe card
- Publication number 20020041189
- Publication date Apr 11, 2002
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
75723795 - STEPVCPC
- Serial number 75723795
- Registration number 2705719
- Filing date Jun 8, 1999
- NIHON DENSHIZAIRYO KABUSHIKI KAISHA
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75676029 - J-PROBE
- Serial number 75676029
- Filing date Apr 2, 1999
- NIHON DENSHIZAIRYO KABUSHIKI KAISHA
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Nihon Denshizairyo Kabushiki Kaisha

Organization

Patents Grantslast 30 patents

Probe card

Probe card

Probe card

Probe card having a coil spring interposed between a support member...

Probe card

Vertical probe card

Apparatus for connecting between substrates

Probe, manufacture of same, and vertically operative type probe car...

Probe for testing a semiconductor integrated circuit

Ring for probe card

Ring for probe card

Ring for probe card

Probe card for maintaining the position of a probe in high temperat...

Probe card in which contact pressure and relative position of each...

Probe card in which contact pressure and relative position of each...

Ion emmissive head and ion beam irradiation device incorporating th...

Fused metal ion source with sintered metal head

Patents Applicationslast 30 patents

Probe card

Probe card

Probe card

Probe card

Probe card

PROBE SHEET AND PROBE SHEET UNIT USING SAME

ARCH TYPE PROBE AND PROBE CARD USING SAME

Probe card

Vertical probe card

Trademarklast 30 trademarks

75723795 - STEPVCPC

75676029 - J-PROBE