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Nippo Precision Co., Ltd.
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Nirasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Maintenance carriage for wafer inspection apparatus and maintenance...
Patent number
9,671,459
Issue date
Jun 6, 2017
Tokyo Electron Limited
Junichi Hagihara
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
WAFER INSPECTION SYSTEM, WAFER INSPECTION APPARATUS AND PROBER
Publication number
20170234924
Publication date
Aug 17, 2017
TOKYO ELECTRON LIMITED
Junichi Hagihara
G01 - MEASURING TESTING
Information
Patent Application
MAINTENANCE CARRIAGE FOR WAFER INSPECTION APPARATUS AND MAINTENANCE...
Publication number
20150115991
Publication date
Apr 30, 2015
TOKYO ELECTRON LIMITED
Junichi Hagihara
G01 - MEASURING TESTING
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last 30 trademarks