NIPPON LASER & ELECTRONICS LAB.

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Nagoya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample chip analyzing device and method for analyzing the same
- Patent number 6,787,364
- Issue date Sep 7, 2004
- Nippon Laser & Electronics Lab.
- Haruo Tajima
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating an anisotropic thin film and an evaluating app...
- Patent number 6,486,951
- Issue date Nov 26, 2002
- NEC Corporation
- Ichiro Hirosawa
- G01 - MEASURING TESTING
Information Patent Grant
Plasma thin-film forming apparatus
- Patent number 5,855,682
- Issue date Jan 5, 1999
- Nippon Laser & Electronics Lab.
- Katsumi Yoneda
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Collective helical-elements structure
- Patent number 5,753,355
- Issue date May 19, 1998
- Nippon Laser & Electronics Lab.
- Nobuhiko Katsura
- E04 - BUILDING

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Patents Applicationslast 30 patents

Information Patent Application
Protein chip holding tool
- Publication number 20030099579
- Publication date May 29, 2003
- NIPPON LASER & ELECTRONICS LAB.
- Kouji Tanaka
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method for analyzing reaction test sample using test sample chip
- Publication number 20020106804
- Publication date Aug 8, 2002
- NIPPON LASER & ELECTRONICS LAB.
- Koji Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Sample chip analyzing device and method for analyzing the same
- Publication number 20020003623
- Publication date Jan 10, 2002
- NIPPON LASER & ELECTRONICS LAB.
- Haruo Tajima
- G01 - MEASURING TESTING